| |
Corelis unveils the first JTAG
controller with eight concurrent TAPs
designed for high-volume parallel testing and in-system
programming
which supports both USB 2.0 and LAN connections
Jump to product page
|
Cerritos, CA – February 11,
2005 – Corelis, Inc. today began shipments of the
NetUSB-1149.1/SE, the test industry’s first
boundary-scan (JTAG) controller that combines the
flexibility of networking, the simplicity of a USB
interface, and the power to run boundary-scan tests and
program Flash memory devices on up to 8 targets
simultaneously. The NetUSB-1149.1/SE is an advanced
multiple-port boundary-scan controller with 8 TAPs that
enables engineers to test and program complex boards
with up to eight TAPS or concurrently run boundary-scan
tests and program CPLDs, FPGAs and Flash memories on up
to 8 JTAG chains.
|
|
 |
|
The NetUSB-1149.1/SE
includes an expansion connector that allows parallel
testing and programming on up to thousands of boards
using optional expansion modules available from Corelis.
The NetUSB-1149.1/SE provides the highest possible scan
vector throughput that is currently available in the
market. Test vectors are delivered at a sustained test
clock (TCK) frequency of 70 MHz on 8 boundary-scan
chains while simultaneously verifying results in
hardware at each individual TAP. Its standard USB 2.0 or
LAN connectors eliminate the requirement to open a PC to
install additional cards. This product was designed to
meet the needs of engineers in the lab or production
environment who require faster and more efficient
testing, programming and debugging of multiple UUTs
(Units Under Test) or of a single UUT with multiple scan
chains. |
|
NetUSB-1149.1/SE tests
and programs concurrently CPLDs, FPGAs and Flash
memories on up to eight boards simultaneously.
|
|
 |
| |
|
|
|
NetUSB-1149.1/SE tests
and programs complex boards with multiple JTAG TAPs.
Each TAP can be accessed individually or combined to
create a single scan
chain on the board.
|
|
 |
Additional features of NetUSB-1149.1/SE include automatic signal
delay compensation for long cable runs to the UUT; the ability
to test the UUT for shorts between power and ground nets and the
availability of up to 16 analog channels for measuring target
supply voltages or other signals up to +/- 50VDC. The
NetUSB-1149.1/SE is now available for shipment and is compatible
with the complete line of Corelis ScanPlus and ScanExpress
boundary-scan test tools.
Corelis Inc. offers a broad line of boundary-scan software and
hardware products that combine exceptional ease-of-use with
advanced technical innovation. Corelis’ ScanPlus and ScanExpress
Boundary-Scan systems are used for interconnect testing as well
as in-system programming of Flash memories, CPLDs and FPGAs.
Corelis’ systems include a complete range of
IEEE-1149.1-compatible boundary-scan testers for PCI, PC-Card,
10/100 LAN, USB 2.0, cPCI/cPXI, PC Card and VXI host interfaces.
Corelis also offers a full-line of JTAG emulation and debugging
tools. Corelis provides custom test engineering services and is
well known for its outstanding customer support.
# # # # |
|
|
|
Media Contact
Ryan Jones
Senior Technical Marketing Engineer
(562) 926-6727 voice
(562) 404-6196 fax
Ryan.Jones@corelis.com
Sign up for Corelis Newsletter
Did you know?
|
|
