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Corelis Introduces Boundary-Scan Test Support for High-Speed
AC-Coupled Interconnects (per IEEE-1149.6 Standard)
ScanExpress Tools v1.04
Extends Boundary-Scan Testing to High-Speed Circuits
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Charlotte, NC – October 26, 2004
– Corelis, Inc. today at the International Test Conference
introduced the first PC-based Boundary-Scan testing system to
support boundary-scan testing of high-speed AC-Coupled
Interconnects based on the new IEEE-1149.6 standard. The
IEEE-1149.6 standard was developed to address the need to extend
boundary-scan test methodologies to the AC-coupled interconnects
between ICs (integrated circuits) that are increasingly being
designed into high-speed networking equipment. Adding boundary
scan testing of AC-coupled signals extends easy to use
boundary-scan board integrity testing to the new frontier of
high-speed signals that until now were difficult to test.
Corelis has added initial support
for IEEE-1149.6 to its industry-leading ScanExpress Tools
suite. ScanExpress Tools v1.04 now enable customers to develop
test procedures using enhanced boundary-scan methods to detect
common interconnect faults on IEEE-1149.6 compatible circuits.
The ScanExpress TPG Automatic Test Pattern Generator now supports
IEEE-1149.6-specific BSDL and cell features and provides test
coverage of capacitive-coupled single-ended and differential
signals.
“Our customers are increasingly
implementing new high-performance designs that incorporate
AC-coupling and differential signaling using IEEE-1149.6
compatible devices,” said Carmy Yellin, Vice-President of
Technology for Corelis. “They have experience and are familiar
with the benefits of boundary-scan testing and want to extend
these to their new products. ScanExpress Tools v1.04 enables
them to do this.”
The ScanExpress Tools version 1.04
CD-ROM is now available for customer installation and is fully
upwards compatible with all ScanPlus and ScanExpress software.
Corelis Inc. offers a broad line of
boundary-scan software and hardware products that combine
exceptional ease-of-use with advanced technical innovation.
Corelis’ ScanPlus and ScanExpress Boundary-Scan systems are used
for interconnect testing as well as in-system programming of
Flash memories, CPLDs and FPGAs. Corelis’ systems include a
complete range of IEEE-1149.1-compatible boundary-scan testers
for PCI, PC-Card, 10/100 LAN, USB 2.0, cPCI/cPXI, PCMCIA and VXI
host interfaces. Corelis also offers a full-line of JTAG
emulation and debugging tools. Corelis provides custom test
engineering services and is well known for its outstanding
customer support.
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Media Contact
Ryan Jones
Senior Technical Marketing Engineer
(562) 926-6727 voice
(562) 404-6196 fax
Ryan.Jones@corelis.com
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