 |
 |
|
- Products
Corelis Products
- How to Buy
How to Purchase Corelis Products
- About Us
Testimonials of Corelis success of reducing cost and reducing time to market.
- News
- Education
Boundary Scan Education
Free Training
Corelis offers free three-day training classes that include a boundary-scan tutorial and hands-on lab exercises using Corelis ScanExpress hardware and software.
Register Now
Tutorials
Featuring Corelis' JTAG Tutorial and BSDL Tutorial, these tutorials give an overview of JTAG architecture, related technologies, and new technology trends.
Design Tips
Corelis Design Tips and Guidelines area provides useful tips and items to consider for successful Design and Testing covering architecture, board-level design, and optimal test coverage.
Whitepapers
Corelis Whitepapers area provides you with additional information to JTAG related topics.
Other Informational Links
These demos provide a brief overview of Corelis software and hardware testing and programming capability and features. Learn more...
FAQ section provides answers to frequently asked questions.
Learn more...
Boundary-Scan Blog features posts from the Corelis Support and Engineering team.
Glossary section provides definitions to terms that are frequently used throughout our website. Learn more...
- Partners
Corelis is a National Instruments Alliance Member, providing complete, high-quality JTAG integration solutions to NI customers.
Corelis is a member of the TI 3rd Party Developer Network, a community of respected, well-established companies offering products and services based on TI analog and digital technology.
Solution Partners work closely with Corelis to pursue technical and business interests for the benefit of both companies.
Corelis VAPs are well known and respected in their market as test services providers; their high quality standards, commitment to customer satisfaction, and efficiency in offering the greatest value separates them from their competitors and are key to their success.
- Forum
- Support
Technical Support
Corelis' dedicated and knowledgeable hardware and software engineers will help you get started with your test procedure or software project. Contact Support
Service Maintenance
Support Services are a cost-effective way to ensure that developers and test engineers maximize their productivity with Corelis tools. Learn More...
Downloads
Here you can download the latest version of your software and obtain documents and files such as application notes, hardware manuals, and device models for increasing productivity. Download Updates
End of Life
Corelis' End of Life policy helps customers better manage their End of Life transition and understand the role that Corelis can play in helping to migrate to alternative Corelis technology. Learn More...
- Contact
JTAG Boundary-Scan Hardware |
|
|||||
|
Home > Products > JTAG Boundary-Scan Products > JTAG Test and Programming Hardware > JTAG Boundary-Scan Controllers |
||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||
|
||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||
|
Interface |
Model |
TAPs |
TCK Speed | |
| USB 2.0 | USB-1149.1/CFM |
1 |
100 MHz |
USB-1149.1/CFM
The USB-1149.1/CFM™ High-Speed single-TAP boundary-scan controller makes adding JTAG test to Teradyne ICTs a snap. Designed specifically for integration into Teradyne TestStation™ and GR228x testers, the USB-1149.1/CFM
offers a clean, convenient boundary-scan solution. |
| USB 2.0 | USB-1149.1/1E |
1 |
100 MHz |
USB-1149.1/1E
The USB-1149.1/1E™ is a high-performance plug-and-play
IEEE-1149.1 Boundary-Scan (JTAG) controller for the
Universal Serial Bus (USB 2.0). The USB-1149.1/1E is a
high-speed device compliant with Revision 2.0 of the USB
Bus Specification. |
| USB 2.0 | USB-1149.1/4E |
4 |
100 MHz |
USB-1149.1/4E
The USB-1149.1/4E™ is a
high-performance plug-and-play IEEE-1149.1 Boundary-Scan (JTAG)
controller for the Universal Serial Bus (USB 2.0). The USB-1149.1/4E
is a high-speed device compliant with Revision 2.0 of the USB Bus
Specification (backward compatible with the full-speed features of
Revision 1.1). |
| USB 2.0 & Ethernet | NetUSB-1149.1/E |
4 |
80 MHz |
NetUSB-1149.1/E
The NetUSB-1149.1/E™ (4 TAPs) is an advanced USB 2.0 and LAN-based controller that can be used in the testing and/or in-system programming (ISP) of devices, boards, or systems compliant with the IEEE-1149.1 standard. The NetUSB-1149.1/E controller supports concurrent (gang) testing and in-system programming of CPLDs and Flash devices at TCK rates of up to 80MHz. Up to 512 boards can be tested and programmed concurrently! The controller connects to the computer either through the USB interface or LAN interface for easy installation at nearby or remote locations. Other features include automatic signal delay compensation for long cable lengths to the UUT, TAP signals, and GPIO discrete signals which are individually programmable from 1.25V to 3.3V, programmable slew rate control and pre-power up test for shorts between power and ground traces on the UUT. For complete information on these two controllers, please refer to the detailed datasheets. |
| USB 2.0 & Ethernet | NetUSB-1149.1/SE |
8 |
70 MHz |
NetUSB-1149.1/SE
The NetUSB-1149.1/SE™ (8 TAPs) is an advanced USB 2.0 and LAN-based controller that can be used in the testing and/or in-system programming (ISP) of devices, boards, or systems compliant with the IEEE-1149.1 standard. The NetUSB-1149.1/SE controller supports concurrent (gang) testing and in-system programming of CPLDs and Flash devices at TCK rates of up to 80MHz. Up to 512 boards can be tested and programmed concurrently! The NetUSB-1149.1/SE also supports an analog voltage measuring capability. The controller connects to the computer either through the USB interface or LAN interface for easy installation at nearby or remote locations. Other features include automatic signal delay compensation for long cable lengths to the UUT, TAP signals, and GPIO discrete signals which are individually programmable from 1.25V to 3.3V, programmable slew rate control and pre-power up test for shorts between power and ground traces on the UUT. For complete information on these two controllers, please refer to the detailed datasheets. |
| PCI | PCI-1149.1/Turbo |
4,8 or 32 (*) |
80 MHz |
PCI-1149.1/Turbo
The PCI-1149.1/Turbo™ is a powerful PCI-based controller that is used
for testing and in-system programming (ISP) of devices, boards, or
systems compliant with the IEEE-1149.1 standard. When combined with a
pod, such as the ScanTAP-4, the PCI-1149.1/Turbo supports concurrent
(gang) testing and in-system programming of CPLDs and Flash devices at
TCK rates of up to 80MHz. The Controller connects to the pod with a high
performance SCSI ribbon cable available in lengths up to 30-feet for
easy installation at remote locations. |
| PCI Express | PCIe-1149.1 |
4,8 or 32 (*) |
80 MHz |
PCIe-1149.1
The PCIe-1149.1™ is an advanced robust system that can be used in the
testing and/or in-system programming (ISP) of devices, boards, or
systems compliant with the IEEE-1149.1 standard. When combined with a
pod, such as the ScanTAP-4, the PCIe-1149.1 supports concurrent (gang)
testing and in-system programming of CPLDs and Flash devices at TCK
rates of up to 80MHz. The Controller connects to the pod with a high
performance SCSI ribbon cable available in lengths up to 30-feet for
easy installation at remote locations. |
| USB 2.0 | QuadTap CFM | 4 | 50 MHz |
QuadTap CFM
Circuit board complexity continues to increase. As physical test access recedes, non-intrusive test methods such as boundary-scan and JTAG embedded test are positioned to close the test coverage gaps, ensuring that test technology keeps pace with design advances such as multi-TAP systems. |
| PXI/cPCI | CPXI-1149.1/Turbo |
4,8 or 32 (*) |
80 MHz |
CPXI-1149.1/Turbo
The CPXI-1149.1/Turbo™ is an advanced
PXI/cPCI-based controller that is used for testing and in-system
programming of devices, boards, or systems compliant with the
IEEE-1149.1 standard. When combined with a pod, such as the
ScanTAP-4, the CPXI-1149.1/Turbo supports concurrent (gang) testing
and in-system programming of CPLDs and Flash devices at TCK rates of
up to 80MHz. Up to 8,000 boards can be tested and programmed
concurrently! |
(*) - With ScanTAP intelligent pod (ScanTAP-4, ScanTAP-8, ScanTAP-32)
Optional Accessory Selection Matrix
| Model |
TAPs |
TCK Speed |
Interface |
|
| Low Voltage Adapter |
1 |
100 MHz |
ALL |
Low Voltage Adapter
The Low Voltage Adapter provides the electrical and mechanical interface needed to connect a Corelis boundary-scan controller to a high density 60-pin Intel XDP (eXtended Debug Port) connector (Samtec BSH-030-01). The XDP port runs at about 1.0V and has 51 pullup/pulldown termination so the Low Voltage Adapter also provides the appropriate level translation and current drive capability. If the target UUT has an Intel XDP connector the user will need a Low Voltage Adapter to access the scan chain. |
| ScanTAP-IsoPod |
1 |
40 MHz |
ALL |
ScanTAP-IsoPod
The Corelis ScanTAP-IsoPod is an add-on accessory that
provides a complete electrical isolation barrier between
the target system and the JTAG Test Access Port (TAP).
It provides electrical isolation of the JTAG controller
TAP signals from the unit under test and enhances the
protection of the equipment against harsh electrical
environments. The digital isolation offered by the
ScanTAP-IsoPod protects boundary-scan controller
hardware from ground potential differences that are
often present in production floors and in other
industrial environments. The ground potential
differences are especially harmful when using computer
powered USB based test and measurement equipment where
the computer and the target system are powered from
different AC power line sources in a noisy industrial
environment. |
| ScanTAP Relay |
1 |
50 MHz |
ScanTAP-4 ScanTAP-8 NetUSB-1149.1/E NetUSB-1149.1/SE |
ScanTAP Relay
The ScanTAP Relay pod is an add-on accessory that contains electro-mechanical relays for engaging and disengaging the boundary-scan Test Access Port (TAP) signals. The ScanTAP Relay pod is operated under host software control and provides mechanical isolation of all the TAP signals, including Ground. It is compatible with the various Corelis ScanTAP intelligent modules and is mostly used when integrating the Corelis boundary-scan test tools with in-circuit testers such as the Agilent 3070. By coupling the power of the ScanExpress boundary-scan tools with that of an in-circuit tester (ICT) such as the Agilent 3070 or the Teradyne Test Station, a complete, integrated solution is now available that offers the best advantages of both technologies. |
Controller Specifications
Programmable Clock
The system-wide TCK rate for all TAP ports is programmable under software control. A wide range of TCK frequencies can be achieved by using the on-board Phase-Locked-Loop (PLL) generation circuitry. Depending on the controller, users are given the ability to select the desired TCK rate from a range of values up to 100 MHz at resolution increments of less than 2%.
Adjustable Low Voltage Outputs
The voltage level of the parallel I/O, the local TAP port, and each pod TAP is software programmable and can be set to any voltage between 1.25V and 3.3V in increments of 0.05V. The ports of the ScanTAP-4, ScanTAP-8, and ScanTAP-32 pods can also be slew rate (fast/slow) adjusted.
Scan Input Signal Delay Compensation
Automatic delay compensation is inserted within the signal paths. This feature solves the well-known problems associated with the combination of high TCK rates and remote target locations at extended distances.
Target Voltage Detection System
The controller and its remote pod include analog-to-digital converters, which can measure connected power voltages from the target. Such voltages from two distinct target levels can be measured and compared against user-defined limits. This feature can provide detailed signal voltage checks at any stage of a test plan.
Automatic Detection of UUT Power Shorts
With the target powered down, a well-regulated drive
current with current limit can be momentarily applied to
the target power bus. By measuring this current, the
approximate load resistance can be calculated. This
provides for the automatic detection of target power
shorts, prior to applying power to the target unit.
Corelis Software/Hardware Flowchart
|
Diagram of
ScanExpress Software
This diagram represents how ScanExpress software
works together in providing a solution optimally geared according to
your needs. Click on the diagram to visit individual
software/hardware pages, or use
the links below.
Need Assistance?
 |
 |
|
If you would like assistance with
implementing JTAG testing in your design, or you are simply
short of resources, our talented and experienced engineering
staff can help you with all your JTAG needs.
|
||
 |
|
|
|
|
|||||||||||||||||||||||||||||||||
 |
|
