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Engineering Services

If you are new to JTAG / boundary-scan, would like assistance with any aspect of implementing boundary-scan testing in your design, or are simply short of resources at present, we can help you. The following are some of the services that we provide:

Testability Review

Corelis can provide you with design consultation and an analysis of your design for  boundary-scan testability. We will review your design and make specific recommendations that if implemented will improve the testability. We can also suggest improvements that will increase test coverage and allow boundary-scan to be implemented in a more cost-effective manner.

This service also includes a test coverage analysis that we recommend to do after schematic capture and before PCB layout. At this stage of product development, Corelis provides you with a comprehensive test coverage reports that identifies all of the boundary-scan nets and pins and classifies them as completely tested, partially tested, or not tested. The report also recommends where to add test points (pads) for physical "nails" access if additional test coverage is required.

Test Development

Corelis will process your design information, create all necessary test vectors, and verify the test vectors using your actual hardware. This is a complete "turn-key" service resulting in a fully verified and debugged boundary-scan test system. For companies short of resources, those who are under a tight deadline, or for those who are new to boundary-scan and want to be testing in the shortest time possible, this is an excellent way to minimize your investment and maximize your effectiveness.

Some of Corelis test development services are listed below:

  • Development of a boundary-scan test procedure including test coverage analysis

  • Interconnect, memories, and clusters testing

  • Flash memories and CPLDS programming

  • Parallel testing and programming of thousands of boards

  • ScanReuse application to ensure maximum reuse of test and programming files when moving to Flying probes and ICTs

  • Deploying testing and in-system programming for field service applications

  • Turn key solution including test fixtures