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Support for ICTs and Flying Probes

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The benefits of boundary-scan are noticed in all phases of the product life cycle. By coupling the power of the ScanExpress boundary-scan tools with that of other production testers such as as the Agilent 3070 ICT, the Teradyne Test Station, and Flying probes. A complete, integrated solution is now available that offers the best advantages of both technologies.

Boundary-scan operates as the perfect companion to the ICT or Flying probe. Boundary-scan is capable of testing areas of printed circuit board assemblies that are difficult to access due to physical space constraints and loss of physical access, which is often due to fine pitch components such as Ball Grid Array (BGA) devices. Conversely, the ICT is able to check the non-boundary-scan compatible portion of the unit under test (UUT) such as analog.

 

Agilent 3070 upgrade


 

Corelis ScanReuse Methodology

Corelis ScanReuse™ methodology and solutions allow customers to reuse in production all the boundary-scan test and programming files created with the ScanExpress System at different phases of the product life cycle. This methodology works for test equipment that customers already own or may decide to purchase in the future.

Corelis provides its customers with the means to reuse all the boundary-scan test and programming files created with the ScanExpress System with the following testers:

  • Functional testers

  • In-circuit testers (ICTs)

  • Flying probes

  • Manufacturing Defect Analyzers (MDAs)

Corelis has partnered with various equipment manufacturers such as Agilent, Teradyne/Genrad,  CheckSum, Takaya, Scorpion, Digitaltest, and others to integrate the ScanExpress tools with these test environments.

Design and test engineers often invest considerable effort creating boundary-scan tests for initial development and prototyping. When the design is released to production, this effort is then duplicated by redeveloping the same boundary-scan tests from scratch for use on an ICT, flying probe, functional tester or MDA.

The integration of the Corelis ScanExpress boundary-scan tools was designed specifically to eliminate this redundant effort and hence unify boundary-scan test procedures across the complete product life cycle.

Boundary-scan tests that are created during development, and executed on bench-top systems, can now be applied directly in these test environments. When faults are detected by the boundary-scan portion of the test, the output of the ScanExpress Advanced Diagnostic is displayed from within the integrated interface, clearly specifying the cause of the fault down to the net and pin level.

Reusing boundary-scan tests created by the design engineer not only dramatically saves time and effort but also increases the quality of the test procedure. The design engineer often has unique insight into the details of the design that can be transferred directly to a more complete and robust test procedure.  The test procedures passed down from engineering are often matured and refined from usage, making them much more valuable to the repair technician when faults are detected.

Please contact Corelis to obtain the latest information regarding packages and support available for your specific test environment.

 

 


JTAG Scan Reuse
Reuse of Boundary-Scan Tests and ISP


CheckSum Analyst Integration
ScanExpress Integration with CheckSum Analyst


ScanExpress Integration with Agilent 3070 ICT
ScanExpress Integration with Agilent 3070 ICT

Teradyne Integration
ScanExpress Integration with Teradyne Test Station

Scorpion Flying Probe Integration
ScanExpress Integration with Scorpion Flying Probe

Digitaltest Flying Probe Integration
ScanExpress Integration with Digitaltest Testers

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