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Corelis Boundary-Scan (JTAG) Controllers |
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Corelis has developed a wide range of boundary-scan
high-performance controllers that are compatible with buses
such as USB 2.0, PCI, PCI Express, PXI/cPCI, Ethernet, VME,
and VXI. Most of Corelis' boundary-scan controllers operate
up to 80MHz sustained TCK frequency. This wide choice of
platforms allows you to select the appropriate level and
cost of boundary-scan hardware tester for the application
while maintaining complete software transportability across
all platforms. The table below lists the various JTAG
controllers offered by Corelis. A brief description of each
controller follows. For complete information on the
controllers, please refer to the detailed data sheets. |
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Controller Selection Matrix
Optional Accessory Selection Matrix
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Controller Selection Matrix
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USB-1149.1/E
The USB-1149.1/E™ is a
high-performance plug-and-play IEEE-1149.1 Boundary-Scan
(JTAG) controller for the Universal Serial Bus (USB
2.0). The USB-1149.1/E is a high-speed device compliant
with Revision 2.0 of the USB Bus Specification (backward
compatible with the full-speed features of Revision
1.1).
The voltage level of the parallel
I/O and the TAP interface is software programmable and
can be set to any voltage between 1.25V and 3.3V in
increments of 0.05V. The USB-1149.1/E TCK output to the
IEEE Standard 1149.1 compatible target system is
programmable under software control and supports speeds
of up to 100MHz.
For complete information on the
USB-1149.1/E, please refer to the detailed data sheet
for this product.
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USB-1149.1/1E
The USB-1149.1/1E™ is a
high-performance plug-and-play IEEE-1149.1 Boundary-Scan
(JTAG) controller for the Universal Serial Bus (USB
2.0). The USB-1149.1/1E is a high-speed device compliant
with Revision 2.0 of the USB Bus Specification.
The voltage level of the parallel I/O and the TAP
interface is software programmable and can be set to any
voltage between 1.25V and 3.3V in increments of 0.05V.
The USB-1149.1/1E TCK output to the IEEE Standard 1149.1
compatible target system is programmable under software
control and supports speeds of up to 100MHz.
Other features include automatic signal delay
compensation for long cable lengths to the UUT,
programmable slew rate control on the TAP signals and
I2C/SPI peripheral interfaces to support programming
serial EEPROM devices.
For complete information on the USB-1149.1/1E, please
refer to the detailed data sheet for this product.
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USB-1149.1/4E
The USB-1149.1/4E™ is a
high-performance plug-and-play IEEE-1149.1 Boundary-Scan
(JTAG) controller for the Universal Serial Bus (USB
2.0). The USB-1149.1/4E is a high-speed device
compliant with Revision 2.0 of the USB Bus Specification
(backward compatible with the full-speed features of
Revision 1.1).
The voltage level of the parallel
I/O and the TAP interface is software programmable and
can be set to any voltage between 1.25V and 3.3V in
increments of 0.05V. The USB-1149.1/4E TCK output to the
IEEE Standard 1149.1 compatible target system is
programmable under software control and supports speeds
of up to 100MHz.
For complete information on the
USB-1149.1/4E, please refer to the detailed data sheet
for this product.
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NetUSB-1149.1/E
NetUSB-1149.1/SE
The NetUSB-1149.1/E™ (4 TAPs) and NetUSB-1149.1/SE™ (8
TAPs) are advanced
USB 2.0 and LAN-based controllers that can be used in the
testing and/or in-system programming (ISP) of devices,
boards, or systems compliant with the IEEE-1149.1
standard. The controllers support concurrent
(gang) testing and in-system programming of CPLDs and
Flash devices at TCK rates up to 80MHz. Up
to 8,000 boards can be tested and programmed
concurrently! The NetUSB-1149.1/SE also
supports an analog voltage measuring capability.
The controllers connect to the computer either through
the USB interface or LAN interface for easy
installation at nearby or remote locations. Other
features include automatic signal delay compensation for
long cable lengths to the UUT, TAP signals and GPIO
discrete signals which are individually programmable
from 1.25V to 3.3V, programmable slew
rate control and pre-power up test for shorts between
power and ground traces on the UUT.
For complete information on these two controllers, please refer to the detailed data sheets. |
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PCIe-1149.1
The PCIe-1149.1™ is an advanced robust system that can
be used in the testing and/or in-system programming
(ISP) of devices, boards, or systems compliant with the
IEEE-1149.1 standard. When
combined with a pod, such as the ScanTAP-4, the
PCIe-1149.1 supports concurrent (gang) testing and
in-system programming of CPLDs and Flash devices at TCK
rates of up to 80MHz. The Controller connects to
the pod with a high performance SCSI ribbon cable
available in lengths up to 30 feet for easy installation
at remote locations.
Other features include automatic signal
delay compensation for long cable lengths to the UUT,
TAP signals and GPIO discrete signals which are
individually programmable from 1.3V to 3.3V, programmable slew rate control and pre-power
up test for shorts between power and ground lines on the UUT. |

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PCI-1149.1/Turbo
The PCI-1149.1/Turbo™ is a
powerful PCI-based controller that is used for testing
and in-system programming (ISP) of devices, boards, or
systems compliant with the IEEE-1149.1 standard. When
combined with a pod, such as the ScanTAP-4, the
PCI-1149.1/Turbo supports concurrent (gang) testing and
in-system programming of CPLDs and Flash devices at TCK
rates of up to 80MHz. The Controller connects to the pod
with a high performance SCSI ribbon cable available in
lengths up to 30 feet for easy installation at remote
locations.
Other features include automatic signal
delay compensation for long cable lengths to the UUT,
TAP signals and GPIO discrete signals which are
individually programmable from 1.3V to 3.3V, programmable slew rate control and pre-power
up test for shorts between power and ground lines on the UUT. |

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CPXI-1149.1/Turbo
The CPXI-1149.1/Turbo™ is an
advanced PXI/cPCI-based controller that is used for
testing and in-system programming of devices, boards, or
systems compliant with the IEEE-1149.1 standard. When
combined with a pod, such as the ScanTAP-4, the
CPXI-1149.1/Turbo supports concurrent (gang) testing and
in-system programming of CPLDs and Flash devices at TCK
rates of up to 80MHz. Up
to 8,000 boards can be tested and programmed
concurrently!
The controller connects to the pod with a high
performance SCSI ribbon cable available in lengths up to
30 feet for easy installation at remote locations.
Other features include automatic signal delay
compensation for long cable lengths to the UUT, TAP
signals and GPIO discrete signals which are individually
programmable from 1.25V to 3.3V,
programmable slew rate control and pre-power up test for
shorts between power and ground traces on the UUT.
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CVME-1149.1
The CVME-1149.1 is a stand-alone
JTAG controller module compatible with the VME bus. The card has 32 TTL compatible parallel
inputs and 32 TTL compatible parallel outputs in
addition to 6 serial boundary-scan ports. The module is
an A16/D16 VME compatible slave module. The card
occupies 64 bytes (32 words) of VME address space which
is equivalent to a 40 hex address block.
CVXI-1149.1
The CVXI-1149.1 is a stand-alone
JTAG / boundary-scan controller module that utilizes the
Texas Instruments SN74ACT8990 Test Bus Controller. The
module occupies a single "C" size VXI slot. It is
compatible with the PC-1149.1 with the exception being
that it is contained in a VXI format. The card contains
32 TTL compatible parallel inputs and 32 TTL compatible
parallel outputs in addition to 6 serial boundary-scan
ports. The module is an A16/D16 VXI compatible slave
module. The card occupies 64 bytes (32 words) of VXI
address space which is equivalent to a 40 hex address
block.
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CVXI-1149.1/IM
The CVXI-1149.1/IM is an
intelligent JTAG controller module with
a true memory behind the pin architecture. The module is
also capable of both pre-and post-processing of
boundary-scan data and reduces host overhead time in the
serialization of test vectors and results processing.
The standard module contains 4M bytes of memory. The
module is an A16/A24/A32, D16, D32 slave with a
programmable VXI bus interrupter. The module occupies a
single "C" size VXI slot.
CVXI-1149.5
The CVXI-1149.5 is an intelligent IEEE-1149.5 compliant
MTM Bus tester. The standard module contains 4M bytes of
memory. The module is an A16/A24/A32, D16, D32 slave
with a programmable VXI bus interrupter. The module
occupies a single "C" size VXI slot.
CVXI-JTM
The CVXI-JTM is an Am29030 RISC processor based JTM
Avionics Bus tester. The standard module contains 4M
bytes of memory. The module is an A16/A24/A32, D16, D32
slave with a programmable VXI bus interrupter. The
module occupies a single "C" size VXI slot.
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Optional Accessories
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ScanTAP-IsoPod
The Corelis ScanTAP IsoPod
is an add-on accessory that provides a complete
electrical isolation barrier between the target system
and the JTAG Test Access Port (TAP). It provides
electrical isolation of the JTAG controller TAP signals
from the unit under test and enhances the protection of
the equipment against harsh electrical environments. The
digital isolation offered by the ScanTAP IsoPod protects
boundary-scan controller hardware from ground potential
differences that are often present in production floors
and in other industrial environments. The ground
potential differences are especially harmful when using
computer powered USB based test and measurement
equipment where the computer and the target system are
powered from different AC power lines sources in a noisy
industrial environment.
For complete information on the ScanTAP IsoPod, go to
the ScanTAP IsoPod product
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ScanTAP-Relay
The ScanTAP Relay pod is an
add-on accessory that contains electro-mechanical relays
for engaging and disengaging the boundary-scan Test
Access Port (TAP) signals. The ScanTAP Relay pod is
operated under host software control and provides
mechanical isolation of all the TAP signals, including
Ground. It is compatible with the various Corelis
ScanTAP intelligent modules and is mostly used when
integrating the Corelis boundary-scan test tools with
in-circuit testers such as the Agilent 3070. By coupling
the power of the ScanExpress boundary-scan tools with
that of an in-circuit tester (ICT) such as the Agilent
3070 or the Teradyne Test Station, a complete,
integrated solution is now available that offers the
best advantages of both technologies. |
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