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Runner-Lite: Complete Structural and Functional Test Solutions

Runner-Lite is a free test executive tool for performing boundary-scan tests, JTAG Embedded Tests (JET), and in-system device programming using pre-generated test plan files built for specific reference boards. Based on ScanExpress Runner, the executive member of Corelis' full-featured ScanExpress software suite, Runner-Lite offers a simple and more streamlined user interface to allow execution of downloadable test plan files designed and made available through Corelis.

Runner-Lite was designed to provide engineers visibility, awareness, and accessibility to board level JTAG testing. The tool applies boundary-scan test patterns to a reference board, reads back the responses, and provides comprehensive fault detection and isolation of boundary-scan chain infrastructure, board interconnect, pull-up/pull-down resistors, and clusters such as CPLDs, memories, and FIFOs. The tool also performs at-speed functional tests on peripheral components connected to the on-board processor. Runner-Lite additionally supports In-System-Programming (ISP) of CPLDs, Flash memories, and serial EEPROM devices.

Runner-Lite includes a powerful graphical fault identification subsystem that helps isolate the location of PCB faults. The tool is able to display a CAD-based photographic representation of a reference design to facilitate the rapid discovery and actual location of any failure, even when they are hidden underneath devices. By using Runner-Lite, engineers have the ability to visually associate fault diagnostic data to the virtual PCB representation.

Runner-Lite offers unrestricted access to complete off-the-shelf JTAG structural and functional test solutions for the most popular silicon vendor reference designs available today. Use it to familiarize yourself with Corelis tool capabilities or use it as a test bench for your own reference board based designs. If you’re new to JTAG or have been hesitant to implement this test technology, let Runner-Lite put circuit board test convenience into your hands.

Click here to download the Runner-Lite Installer!

Main Features

• Built-in test sequencer that automatically executes independent test steps

• Executes structural and functional board tests via a simple JTAG connection

• Complete ready-to-run reference design test procedures

• Detects and isolates faults down to the net and pin level

• Easy-to-use graphical user interface

• Programs Flash & other programmable devices

• Detailed fault reports and proximity diagnostics

Additional Features

• Fault diagnostics are linked to a virtual PCB image

• Identifies failures by fault type including stuck-at, open, and short

• Double-sided PCB support

• Powerful zoom, pan, auto-center, and filter functions

• Netlist & parts browser highlights component, pin, and via locations

Benefits

• Complete, ready-to-use board test solution, including at-speed and interactive functional tests

• Fully working test procedures means zero test development time

• No test fixtures and no physical test probes required

• Find faults before any application code is ready

• Relieves software engineers from the necessity of developing test code

• Quickly identifies hardware faults allowing designers to focus on product features

• Boards do not have to be in a bootable state for fault diagnostics

• Rapidly release prototypes by spending less time debugging hardware problems

• Flash programming at maximum theoretical programming rates

• Allows complete control and visibility of UUT resources

• Accelerates diagnosis and repair of faulty circuit boards

Reference Board Test Procedure Download

Each Runner-Lite test plan is custom built for a particular reference design and includes relevant test steps to perform structural testing, functional testing, and In-System Programming (ISP). Runner-Lite connects to the board through its standard JTAG Test Access Port (TAP). Click on a link below to jump to a specific reference board web page.

Board Name
TI OMAP35x EVM	Developed with Mistral Solutions, the OMAP35x Evaluation Module (EVM) enables developers to immediately start evaluating OMAP35x processors (OMAP3530, OMAP3525, OMAP3515, OMAP3503) and begin building low power applications

The Runner-Lite Interface

Runner-Lite Editorial

	Read more about Runner-Lite in this article from the 2011 Embedded Processing & DSP Resource Guide from Texas Instruments.