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In-Circuit Tester Integration
The benefits of
boundary-scan are noticed in all phases of a product
life cycle. By coupling the
power of Corelis boundary-scan tools with an In-Circuit
Tester (ICT), a complete, integrated solution is
available that offers the best advantages of both
technologies.
Boundary-scan operates as the perfect companion to ICT.
Boundary-scan is capable of testing areas of printed
circuit board assemblies that are difficult to access
due to physical space constraints and loss of physical
access, which is often due to fine pitch components such
as Ball Grid Array (BGA) devices. Conversely, the ICT is
able to check the non-boundary-scan compatible portion
of the unit under test (UUT) such as analog.
Integrating Corelis boundary-scan tools with ICT into a
single test system forms a powerful and cost-effective
solution that virtually eliminates each of the obstacles
that are presented to the individual test technologies.
By utilizing the benefits of both boundary-scan and ICT,
complete test procedures can be created in a minimal
time frame that provide outstanding test coverage of the
entire printed circuit board assembly.
The efficiency of boundary-scan is extended still
further by the added benefits of JTAG-based
In-System-Programming. Flash memories and other PLD
devices can be programmed in-system by simply including
programming steps into the boundary-scan test plan.
Combining the effectiveness of boundary-scan with the
power and flexibility of ICT produces a unified test
methodology that is robust, extensive, and easy to use.
With the appropriate use of boundary-scan, test fixtures
can be greatly simplified, leading directly to reduced
test cost and development time.
Also see
Support for ICTs and Flying Probes
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Engineering Services
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