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In-Circuit Tester Integration

The benefits of boundary-scan are noticed in all phases of a product life cycle. By coupling the power of Corelis boundary-scan tools with an In-Circuit Tester (ICT), a complete, integrated solution is available that offers the best advantages of both technologies.

Boundary-scan operates as the perfect companion to ICT. Boundary-scan is capable of testing areas of printed circuit board assemblies that are difficult to access due to physical space constraints and loss of physical access, which is often due to fine pitch components such as Ball Grid Array (BGA) devices. Conversely, the ICT is able to check the non-boundary-scan compatible portion of the unit under test (UUT) such as analog.

Integrating Corelis boundary-scan tools with ICT into a single test system forms a powerful and cost-effective solution that virtually eliminates each of the obstacles that are presented to the individual test technologies. By utilizing the benefits of both boundary-scan and ICT, complete test procedures can be created in a minimal time frame that provide outstanding test coverage of the entire printed circuit board assembly.

The efficiency of boundary-scan is extended still further by the added benefits of JTAG-based In-System-Programming. Flash memories and other PLD devices can be programmed in-system by simply including programming steps into the boundary-scan test plan.

Combining the effectiveness of boundary-scan with the power and flexibility of ICT produces a unified test methodology that is robust, extensive, and easy to use. With the appropriate use of boundary-scan, test fixtures can be greatly simplified, leading directly to reduced test cost and development time.

Also see Support for ICTs and Flying Probes
 

      

 

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USB-1149.1/CFM High-Performance Boundary-Scan Controller for Teradyne In-Circuit-Testers

USB-1149.1/CFM

USB-1149.1/CFM High-Performance Boundary-Scan Controller for Teradyne In-Circuit-Testers

The USB-1149.1/CFM™ High-Speed single-TAP boundary-scan controller makes adding JTAG test to Teradyne ICTs a snap. Designed specifically for integration into Teradyne TestStation™ and GR228x testers, the USB-1149.1/CFM offers a clean, convenient boundary-scan solution.

Adding boundary-scan without losing the ICT investment is an attractive prospect—by combining ICT and boundary-scan, test engineers are achieving the benefits of these complementary technologies and the highest possible test coverage.

Download USB-1149.1/CFM Datasheet

 

Teradyne
In-Circuit Tester Integration
USB-1149.1/CFM

 
   
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