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Test Fixture Integration

Testability Maximization

Test fixtures offer a versatile way to maximize testability. When designed properly, a test fixture can be reused at multiple test stages, including boundary-scan, ICT and functional. For boundary-scan testing, fixtures offer means to combine multiple boundary-scan chains together, add voltage level shifters, interface to external connectors for increased test coverage, and even test multiple boards simultaneously.

Corelis can help specify boundary-scan requirements for existing fixtures or can help move the test fixture development process from start to finish by working with our Value Added Partners. Both single unit and multiple unit fixtures are supported to satisfy any level of manufacturing volume.

 
     

 

Engineering Services

Turn-Key Test Fixture Integration 

 
   
JTAG Products

JTAG Products

JTAG Interconnect, ISP, and Functional Test Solutions

Bus Analyzers

Bus Analyzers

I2C and ARINC-629 Bus Analysis Solutions

DSP Emulators

DSP Emulators

Debug Tools for TI-based Processors

Engineering

Engineering

Request DFT Reviews, Test Procedures, and Turn-Key Solutions

 

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