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Tag Archives: flash programming

Corelis ScanExpress Systems for VDATS

We announced last week Corelis‘  inclusion as an optional component for Versatile Depot Automatic Test Station (VDATS). Adding Corelis JTAG/boundary-scan capability to the VDATS system allows organizations to support JTAG-enabled systems with boundary-scan structural test, in-system-programming, and JTAG embedded functional test. Corelis JTAG is a perfect fit for VDATS–by limiting the pin interface to a simple JTAG TAP, boundary-scan capable systems provide …

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Flash Programming – Part 3 of Test Coverage Q and A

Part 3: Flash Programming In-system-programming is a popular application of JTAG/Boundary-scan, but what about test coverage? How can flash (and other non-volatile memories) be tested and what kind of test coverage is available? In this article we’ll explore which flash tests offer coverage and how that coverage is presented in ScanExpress DFT Analyzer. Q: How do ScanExpress tools handle calculate test coverage …

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SPI Flash Component Programming

IntroductionIn light of the discussion in our last installment about the relationship between JTAG and SPI, it’s no surprise that there is overlap with JTAG and SPI tools. Newer Corelis JTAG controllers include capabilities for direct communication with…

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SPI Flash Programming and Data Files for Atmel AT45

IntroductionA peculiar case pops up in our customers’ applications from time to time: The Atmel AT45 series serial Flash is on a board and needs to be programmed. These parts offer a configurable page size that has results in some peculiar addres…

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Corelis Boundary-Scan Blog