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Tag Archives: scanexpress

Corelis ScanExpress Systems for VDATS

We announced last week Corelis‘  inclusion as an optional component for Versatile Depot Automatic Test Station (VDATS). Adding Corelis JTAG/boundary-scan capability to the VDATS system allows organizations to support JTAG-enabled systems with boundary-scan structural test, in-system-programming, and JTAG embedded functional test. Corelis JTAG is a perfect fit for VDATS–by limiting the pin interface to a simple JTAG TAP, boundary-scan capable systems provide …

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Tip: Send a JTAG test log to your e-mail account using Blat

Tip: Send a test log to your e-mail account using Blat Introduction Being notified when a test plan completes can be very useful for those times when you’ll be a way from the test station but need to know when the test has finished. Luckily it’s very easy to send a test log by e-mail using ScanExpress tools and the …

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TI AM335x ARM CortexT-A8 CPU Support for JET (JTAG Embedded Test)

For ScanExpress JETThe next release of ScanExpress JET includes a new CPU support package for Texas Instruments AM335x (ARM Cortex-A8) Sitara CPUs.The AM335x CPU support package includes auto-generated tests for the CPU and common periphera…

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Gang Programming: New ScanExpress Programmer Feature

IntroductionBeginning with version 1.08 (available as part of the ScanExpress CD v7.5), the ScanExpress Programmer JTAG module includes gang (concurrent) programming support for up to 4 UUTs with supported multi-TAP JTAG controllers. By programming 4 UUT…

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SPI Bus and ScanExpress Tools

IntroductionOver the next few weeks, we’ll take a look at the SPI bus and how it relates to Corelis tools including ScanExpress TPG, ScanExpress Runner, and ScanExpress Programmer. ScanExpress tools support direct access to the SPI bus on the latest JTAG…

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