Home » Tag Archives: TAP

Tag Archives: TAP

4 shunt tips for JTAG boundary-scan testing

Harwin M7581-05

Shorting jumper shunts are frequently used to configure a unit under test (UUT) a particular way for boundary-scan testing–perhaps a compliance enable signal must be met or FPGA configuration needs to be inhibited. Because these shunts are meant to configure the system for test mode and could cause functional failures, it is important to ensure that test-only shunts are removed ...

Read More »
Corelis Boundary-Scan Blog