Tag Archives: test coverage

Part 3: Flash Programming In-system-programming is a popular application of JTAG/Boundary-scan, but what about test coverage? How can flash (and other non-volatile memories) be tested and what kind of test coverage is available? In this article we’ll explore which flash tests offer coverage and how that coverage is presented in ScanExpress DFT Analyzer. Q: How do ScanExpress tools handle calculate test coverage ...