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Tag Archives: test

Corelis ScanExpress Systems for VDATS

We announced last week Corelis‘  inclusion as an optional component for Versatile Depot Automatic Test Station (VDATS). Adding Corelis JTAG/boundary-scan capability to the VDATS system allows organizations to support JTAG-enabled systems with boundary-scan structural test, in-system-programming, and JTAG embedded functional test. Corelis JTAG is a perfect fit for VDATS–by limiting the pin interface to a simple JTAG TAP, boundary-scan capable systems provide …

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Tip: Send a JTAG test log to your e-mail account using Blat

Tip: Send a test log to your e-mail account using Blat Introduction Being notified when a test plan completes can be very useful for those times when you’ll be a way from the test station but need to know when the test has finished. Luckily it’s very easy to send a test log by e-mail using ScanExpress tools and the …

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Cortex-M3/STM32 JTAG Embedded Test (JET)

ScanExpress JET version 2.06, included on the ScanExpress v7.5 CD and on ourdownload site, adds support for ARM Cortex™-M3 cores starting with the STM32 family. STM32 is an entry-to-mid level 32-bit microcontroller family, boasting more than…

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