Corelis Announces a Boundary-Scan Test and In-System Programming Upgrade Kit for the Agilent 3070 In-Circuit UNIX and PC-based Testers
Utilizing the benefits of both the Agilent 3070 ICT and Corelis’ highest performance
boundary-scan technology, test procedures can be created in a minimal time frame
that provide outstanding test coverage of the entire board assembly.
Cerritos, CA, June 27, 2003 – Corelis, Inc. recently integrated its ScanPlus boundary-scan tools with the Agilent 3070 In-Circuit Tester (ICT) producing an upgrade kit called ScanPlus ICT. This integration creates a powerful, cost-effective testing and in-system programming solution that virtually eliminates the obstacles to individual test technologies.
Boundary-scan provides the capability to test most digital portions of the Unit Under Test (UUT) including areas that are difficult to physically access such as BGA devices. Conversely, the Agilent 3070 ICT is able to check the non-boundary-scan areas of the UUT such as the analog portion. The ScanPlus ICT system allows the relatively quick creation of a unified test plan for both systems. The capability for in-system programming of CPLD and/or flash devices can simply be added as a step in the boundary-scan test plan as well.
Design and test engineers often invest considerable effort creating boundary-scan tests for initial development and prototyping. When the design is released to production, this effort is duplicated for use on an ICT by redeveloping the same boundary-scan tests from scratch. The integration of the Corelis ScanPlus boundary-scan tools and the Agilent 3070 was designed specifically to eliminate this redundant effort and hence unify boundary-scan test procedures across the complete product life cycle. Boundary-scan tests that are created during development and executed on bench-top systems can now be applied directly by the Agilent 3070. Reusing boundary-scan tests created by the design engineer saves dramatically on time and effort, and increases the quality of the test procedure itself. Function calls to execute boundary-scan test plans can be seamlessly integrated with any existing Agilent 3070 test program. Faults that are detected by the boundary-scan tests are clearly indicated, providing fault-diagnostics down to the net and pin level.
The ScanPlus ICT also allows the flexibility of creating boundary-scan test plans on a separate machine, leaving the Agilent 3070 system itself available until the actual testing is to be done. Test developers can generate complete boundary-scan test plans on Windows-based workstations and fully direct their execution via the UNIX or PC-based Agilent 3070 production system.
Corelis Inc., offers a broad line of boundary-scan software and hardware products for interconnect testing, in-system programming of Flash memories, CPLDs, FPGAs, JTAG emulation and debugging. It includes a full range of IEEE Std 1149.1 boundary-scan testers for the ISA, PCI, PCMCIA, LAN, USB, cPCI/PXI and VXI busses. Corelis also provides various engineering services and is well known for its outstanding customer support.