Corelis introduces a boundary-scan controlled Digital I/O Module that enables testing of Low Voltage Differential Signals (LVDS)
Use of IEEE-Std-1149.1 controlled parallel pin electronics
drastically reduces cost of digital testing including LVDS.
Cerritos, CA, October 3, 2005 — Corelis Inc., introduced today a boundary-scan controlled ScanIO-300LV digital module targeted at development, manufacturing, and service test applications for printed circuit boards and complex IC’s. The ScanIO-300LV Programmable Digital I/O module turns an IEEE–STD-1149.1 boundary-scan controller into a powerful digital interconnect tester. It uses boundary-scan compatible logic to add control and visibility to connectors, traces, and logic that are otherwise not testable using traditional scan techniques. Each line is an independently controlled bi-directional signal and can be individually configured as an input or output or both.
ScanIO-300LV supports up to 300 (or 150 differential LVDS pairs) boundary-scan controllable digital I/O lines per module. Multiple ScanIO-300LV modules can be cascaded to support up to thousands of digital I/O lines. The ScanIO-300LV integrates seamlessly with the ScanExpress TPG Test Program Generator and does not require modifying the UUT netlist or merging the UUT netlist with the ScanIO-300LV data to create test patterns for the combined configuration. This product will assist customers in increasing the boundary-scan test coverage of their products.
“The use of the ScanIO‑300LV modules to augment boundary scan testers can significantly lower test development cost and greatly enhance test coverage, thus reducing time to market, lowering test costs and improving product quality.” – said Steve Hartman, product marketing manager of Corelis Inc. “Compared to traditional test strategies involving in-circuit testers, boundary-scan in combination with a ScanIO‑300LV module to cover non-scanable nets provides a tremendous savings in both hardware and software cost.”
The ScanIO-300LV is available from stock.
Corelis Inc., offers a broad line of boundary-scan software and hardware products that combine exceptional ease-of-use with advanced technical innovation. Corelis’ ScanPlus and ScanExpress Boundary-Scan systems are used for interconnect testing as well as in-system programming of Flash memories, CPLDs and FPGAs. Corelis’ systems include a complete range of IEEE-1149.1-compatible boundary-scan testers for PCI, PC-Card, 10/100 LAN, USB 2.0, cPCI/cPXI, and VXI host interfaces. Corelis also offers a full-line of JTAG emulation and debugging tools. Corelis provides custom test engineering services and is well known for its outstanding customer support.