by Corelis Inc. Corelis Inc.

Corelis Introduces High-Performance Boundary-Scan (JTAG) Test Support for Semiconductor, SOC and ASIC IC Testers

Remote Diagnostics v1.0 Extends Corelis’ High-Performance
Boundary-Scan Testing to Semiconductor Testers

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Cerritos, CA – October 26, 2004 – Corelis, Inc. today introduced the test industry’s first boundary-scan (JTAG) tools that enable customers to port boundary-scan tests to semiconductor testers and remotely diagnose test results on a network PC. WGL (Waveform Generation Language) Remote Diagnostics v1.0 enables users to view boundary-scan test results downloaded from a third party chip tester to a remote PC and diagnose the results off-line, saving tester time. Using Corelis’ WGL Diagnostic 1.0 software, high performance boundary-scan test vectors developed with Corelis’ ScanExpress TPG Automatic Test Pattern Generator can be ported to, and executed on, third parties IC test platforms such as semiconductor testers, SOC and ASIC testers and functional testers.

WGL Diagnostics 1.0 reduces the high cost to users of operating expensive chip testers by diagnosing boundary-scan faults off-line on a remote PC.  This product was designed to meet the needs of engineers designing complex multi-chip modules (MCM) who use the WGL format to run test vectors on the Agilent 83K, Agilent 93K and other testers as well as engineers who use semiconductor testers to qualify boundary-scan compatible devices.

“Our WGL Diagnostics 1.0 minimizes expensive semiconductor tester use time while providing essential boundary-scan test results in the user-friendly format similar to our industry-leading ScanPlus Runner product,” said Carmy Yellin, Vice President of Technology for Corelis. “Our boundary-scan tests are easy to produce and are widely accepted by many customers who also develop their own ASICs. Running boundary scan tests in conjunction with the native tests of a semiconductor tester provide a new level of diagnostic visibility to our customers.”

Additional features of WGL Diagnostics 1.0 include the ability to edit test vectors which are otherwise inaccessible to the user as well as the ability to perform custom boundary-scan operations and simulate abnormal waveform situations. Also, WGL Diagnostics 1.0 provides engineers a way to diagnose difficulties with non-conforming devices, fix them and successfully scan them using edited test vectors.

The WGL Diagnostic v1.0 CD-ROM is now available for customer installation and is compatible with the Corelis ScanPlusTPG and ScanExpress TPG boundary-scan test generation tools.

Corelis Inc. offers a broad line of boundary-scan software and hardware products that combine exceptional ease-of-use with advanced technical innovation. Corelis’ ScanPlus and ScanExpress Boundary-Scan systems are used for interconnect testing as well as in-system programming of Flash memories, CPLDs and FPGAs. Corelis’ systems include a complete range of IEEE-1149.1-compatible boundary-scan testers for PCI, PC-Card, 10/100 LAN, USB 2.0, cPCI/cPXI, PCMCIA and VXI host interfaces. Corelis also offers a full-line of JTAG emulation and debugging tools. Corelis provides custom test engineering services and is well known for its outstanding customer support.

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