by Corelis Inc. Corelis Inc.

Corelis unveils the first JTAG controller with eight concurrent TAPs designed for high-volume parallel testing and in-system programming which supports both USB 2.0 and LAN connections

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NetUSB 1149 Small - Corelis unveils the first JTAG controller with eight concurrent TAPs designed for high-volume parallel testing and in-system programming which supports both USB 2.0 and LAN connectionsCerritos, CA – February 11, 2005 – Corelis, Inc. today began shipments of the NetUSB-1149.1/SE, the test industry’s first boundary-scan (JTAG) controller that combines the flexibility of networking, the simplicity of a USB interface, and the power to run boundary-scan tests and program Flash memory devices on up to 8 targets simultaneously. The NetUSB-1149.1/SE is an advanced multiple-port boundary-scan controller with 8 TAPs that enables engineers to test and program complex boards with up to eight TAPS or concurrently run boundary-scan tests and program CPLDs, FPGAs and Flash memories on up to 8 JTAG chains.

NetUSB-1149.1/SE tests and programs concurrently CPLDs, FPGAs and Flash memories on up to eight boards simultaneously.

NetUSB 1149 SE with targets - Corelis unveils the first JTAG controller with eight concurrent TAPs designed for high-volume parallel testing and in-system programming which supports both USB 2.0 and LAN connections

NetUSB-1149.1/SE tests and programs complex boards with multiple JTAG TAPs. Each TAP can be accessed individually or combined to create a single scan chain on the board.

NetUSB 1149 SE with target - Corelis unveils the first JTAG controller with eight concurrent TAPs designed for high-volume parallel testing and in-system programming which supports both USB 2.0 and LAN connections

The NetUSB-1149.1/SE includes an expansion connector that allows parallel testing and programming on up to thousands of boards using optional expansion modules available from Corelis. The NetUSB-1149.1/SE provides the highest possible scan vector throughput that is currently available in the market. Test vectors are delivered at a sustained test clock (TCK) frequency of 70 MHz on 8 boundary-scan chains while simultaneously verifying results in hardware at each individual TAP. Its standard USB 2.0 or LAN connectors eliminate the requirement to open a PC to install additional cards. This product was designed to meet the needs of engineers in the lab or production environment who require faster and more efficient testing, programming and debugging of multiple UUTs (Units Under Test) or of a single UUT with multiple scan chains.

Additional features of NetUSB-1149.1/SE include automatic signal delay compensation for long cable runs to the UUT; the ability to test the UUT for shorts between power and ground nets and the availability of up to 16 analog channels for measuring target supply voltages or other signals up to +/- 50VDC. The NetUSB-1149.1/SE is now available for shipment and is compatible with the complete line of Corelis ScanPlus and ScanExpress boundary-scan test tools.

Corelis Inc. offers a broad line of boundary-scan software and hardware products that combine exceptional ease-of-use with advanced technical innovation. Corelis’ ScanPlus and ScanExpress Boundary-Scan systems are used for interconnect testing as well as in-system programming of Flash memories, CPLDs and FPGAs. Corelis’ systems include a complete range of IEEE-1149.1-compatible boundary-scan testers for PCI, PC-Card, 10/100 LAN, USB 2.0, cPCI/cPXI, PC Card and VXI host interfaces. Corelis also offers a full-line of JTAG emulation and debugging tools. Corelis provides custom test engineering services and is well known for its outstanding customer support.

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