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JTAG 3rd Party Controller Support

Corelis offers support for a variety of devices and instruments from third-parties in an effort to provide existing test platforms comprehensive JTAG test execution with Corelis ScanExpress software products. Supported instruments include National Instruments PXI-655x HSDIO and Teradyne Di-Series modules. Corelis also provides support for JTAG testing with FTDI FT2232 ICs embedded on a unit under test (UUT).

Product Selection Matrix

A listing of available 3rd Party Controllers is provided in the following table:

National Instruments

National Instruments HSDIO

High-Speed Digital I/O Support for ScanExpress
  • Complete support for NI PXI/PCI/PXIe-655x HSDIO Instruments.
  • Single TAP JTAG controller.
  • Wide range of JTAG signal output voltage level support including 1.2V, 1.5V, 1.8V, 2.5V, 3.3V, and 5.0V.
  • Output drive strength up to 50mA per channel.
  • JTAG input signal protection up to 6.8V.
  • Free-running clock with user adjustable speeds up to 30 MHz.

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Teradyne

Teradyne Di-Series Support

Digital I/O Instrument Support for ScanExpress
  • Complete support for Teradyne Di-Series instruments with Corelis ScanExpress software tools.
  • The Teradyne Di-Series instrument acts as a single-TAP JTAG controller with configurable pinout.
  • Adjustable TCK rate; up to 50 MHz on supported models.
  • Configurable voltage level, threshold definitions, and slew rate.
  • Three (3) user-controlled discrete general purpose I/O signals.

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USB 2 JTAG Diagram

Embedded USB2JTAG

FTDI FT2232 JTAG support for ScanExpress
  • Integration and support for FTDI FT2232 USB slave converters with Corelis ScanExpress software tools.
  • The FTDI FT2232 component acts as a single-TAP JTAG controller integrated on the board.
  • Selectable serial channel on supported multi-channel models allows dual-use as a JTAG controller and UART/FIFO/serial host.
  • Adjustable TCK rate up to 30 MHz.
  • Three (3) user-controlled discrete general purpose I/O signals.

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