Boundary-scan has proven itself time and again to be a truly versatile interface for structural test, embedded functional test, built-in self-test (BIST), software debug, and in-system programming. Supporting such diverse applications requires a controller with high performance specifications and diverse features.
The NetUSB II is a high-performance, multi-feature boundary-scan controller for multi-TAP and concurrent JTAG test and in-system programming. Featuring dual-interface USB and LAN support with four or eight independent and configurable Test Access Ports (TAPs), direct serial programming capability and voltage sense support, the NetUSB II fits a multitude of boundary-scan applications.
Scan Function Library
For applications that require a low-level interface or integration with third-party software, Corelis offers a Scan Function Library (SFL). The SFL is provided as a DLL for Microsoft Windows and provides all functions necessary to operate the JTAG port to send and receive JTAG instructions and data from the target system. The SFL can be incorporated in custom application software or integrated with third-party systems such as National Instruments LabVIEW, National Instruments TestStand, and Keysight VEE.