High-Performance Boundary-Scan Controller for Teradyne In-Circuit-Testers

As circuit and system complexities increase, test point access for in-circuit test (ICT) continues to decrease at a rapid rate; new design features such as buried vias and ball-grid-arrays (BGA) present a difficult, if not impossible situation for any ICT system to gain access to system nets.

Adding boundary-scan without losing the ICT investment is an attractive prospect—by combining ICT and boundary-scan, test engineers are achieving the benefits of these complementary technologies and the highest possible test coverage.

The USB-1149.1/CFM™ High-Speed single-TAP boundary-scan controller makes adding JTAG test to Teradyne ICTs a snap. Designed specifically for integration into Teradyne TestStation™ and GR228x testers, the USB-1149.1/CFM offers a clean, convenient boundary-scan solution.


  • High-performance JTAG controller with I2C and SPI interfaces
  • Supports IEEE-1149.1 and IEEE-1149.6 for advanced digital networks
  • User programmable JTAG TCK rate up to 100 MHz, SPI SCK rate up to 50 MHz, and I2C SCL rate up to 5 MHz
  • Custom Function Module (CFM) form factor fits in a single slot of a Custom Function Board (CFB) on the Teradyne tester
  • Variable output voltage and configurable input voltage threshold
  • On-board relays completely isolate JTAG and ICT operations
  • Three general purpose I/O channels
  • High-speed bus-powered USB 2.0 interface
  • Scan Function Library software supports Microsoft Windows 7, Windows 8/8.1 and Windows 10 operating systems

High Performance, Tight Integration

The Corelis USB-1149.1/CFM™ JTAG controller is compliant with the IEEE Standard 1149.1 for test access and is fully capable of executing 1149.1 and 1149.6 tests. The USB-1149.1/CFM integrates effortlessly within the Teradyne system and interfaces with Corelis ScanExpress software. Integrated SPI and I2C programming features make the USB-1149.1/CFM an ideal and universal solution for combined boundary-scan, JTAG embedded test, and ISP.


Designed for TestStation™

The USB-1149.1/CFM was designed specifically for use with Teradyne TestStation and GR228x series Testers. The CFM form factor boards fits directly into one of four slots in a Teradyne CFB. Integration is simple and transparent; once installed in the system, the USB- 1149.1/CFM JTAG, GPIO, I2C, and SPI signals are available to test fixtures and the tester backplane.


Supports Teradyne TestStation™ and legacy GR288x In-Circuit Test systems.
Requires one Custom Function Module slot on a Teradyne Custom Function Board.





Boundary-Scan Test

Integrate boundary-scan testing with Teradyne ICTs, complete with support for IEEE-1149.6 AC-coupled tests.

JTAG Embedded Test

Add at-speed functional tests by taking control of a CPU JTAG debug port, without requiring boot code.

In-System Programming (ISP)

Directly erase, program, and verify Flash, EEPROMs, CPLDs, FPGAs, and other programmable devices.


  • Save time at test stations with high performance JTAG features—up to 100 MHz for lightning fast test and in-system-programming speeds.

  • Increase system capability by integrating Corelis boundary-scan hardware and software directly into the Teradyne ICT.

  • Reduce costs associated with fixtures; adding boundary-scan test coverage reduces the amount of test points required.

  • Compatible with the complete ScanExpress™ family of boundary-scan, ISP, and JTAG embedded test software.

Software Support ScanExpress Tools

Corelis offers a complete family of boundary-scan test, JTAG embedded test, and in-systemprogramming tools—all fully compatible and with the USB- 1149.1/CFM advanced features.

Ordering Information

Part Number 10410

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