Corelis has developed a wide range of high-performance boundary-scan controllers that are compatible with buses such as USB 2.0, PCI, PCI Express, PXI/cPCI, Ethernet, VME, and VXI. Most of Corelis’ boundary-scan controllers operate up to 80 MHz sustained TCK frequency. This wide choice of platforms allows greater flexibility to meet specific price and performance criteria for a given application while maintaining complete software transportability across all hardware platforms.
Controller Selection Matrix
The table below lists both current and legacy JTAG controllers offered by Corelis. Click on the controller model below to find out more about each of our JTAG Boundary-Scan Controllers. A brief description of each controller follows. For complete information on the controllers, please refer to the detailed datasheets. For additional feature sets, view the Optional Accessory Selection Matrix tab.
Transient Suppression for Corelis JTAG Controllers
- Transient voltage suppression for ESD, EFT, and lightning events
- Integrated 10-Ohm series resistors for current limiting
- IEC 61000−4−2 Level 4 ESD protection
- Short 3” cable length between JTAG controller and adapter minimizes performance impact
TAP Adapter for Corelis JTAG Controllers
- Converts JTAG signal levels between a TTL scan controller and a low voltage Unit Under Test (UUT).
- Supports clock speeds up to 100 MHz.
- Automatically detects and matches UUT reference voltage levels between 0.4V and 2.5V based on UUT connector pin.
- Capable of driving output signals up to 90 mA, readily accommodating 50 ohm loads.
Complete TAP Signal Isolation for Corelis Boundary-Scan Controllers
- 4 kV isolation barrier helps prevent damage to hardware
- 3.3 V TAP interface; Supports I2C and SPI programming speeds up to 1 MHz
- Supports JTAG test clock (TCK) frequencies up to 40 MHz
- Supports I2C and SPI programming speeds up to 1 MHz
Corelis JTAG Controller Features
The system-wide TCK rate for all TAP ports is programmable under software control. A wide range of TCK frequencies can be achieved by using the on-board Phase-Locked-Loop (PLL) generation circuitry. Depending on the controller, users are given the ability to select the desired TCK rate from a range of values up to 100 MHz at resolution increments of less than 2%.
Adjustable Low Voltage Outputs
The voltage level of the parallel I/O, the local TAP port, and each pod TAP is software programmable and can be set to any voltage between 1.25V and 3.3V in increments of 0.05V. The ports of the ScanTAP-4 and ScanTAP-8 pods can also be slew rate (fast/slow) adjusted.
Scan Input Signal Delay Compensation
Automatic delay compensation is inserted within the signal paths. This feature solves the well-known problems associated with the combination of high TCK rates and remote target locations at extended distances.
Target Voltage Detection System
The controller and its remote pod include analog-to-digital converters, which can measure connected power voltages from the target. Such voltages from two distinct target levels can be measured and compared against user-defined limits. This feature can provide detailed signal voltage checks at any stage of a test plan.
Automatic Detection of UUT Power Shorts
With the target powered down, a well-regulated drive current with current limit can be momentarily applied to the target power bus. By measuring this current, the approximate load resistance can be calculated. This provides for the automatic detection of target power shorts, prior to applying power to the target unit.