JTAG Boundary-Scan Controllers

runner gang - JTAG Boundary-Scan Controllers

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Corelis has developed a wide range of high-performance boundary-scan controllers that are compatible with buses such as USB 2.0, PCI, PCI Express, and Ethernet. Many of Corelis’ boundary-scan controllers operate up to 100 MHz sustained TCK frequency. This wide choice of platforms allows greater flexibility to meet specific price and performance criteria for a given application while maintaining complete software transportability across all hardware platforms.

Controller Selection Matrix

The table below lists both current and legacy JTAG controllers offered by Corelis.   Click on the controller model below to find out more about each of our JTAG Boundary-Scan Controllers.  A brief description of each controller follows. For complete information on the controllers, please refer to the detailed datasheets.  For additional feature sets, view the Optional Accessory Selection Matrix tab.

NetUSBII 4tap 300x200 - JTAG Boundary-Scan Controllers

NetUSB II™ 4 TAP

The NetUSB II™ 4 TAP is a high-performance, multi-feature boundary-scan controller for multi-TAP and concurrent JTAG test and in-system programming.
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NetUSBII 8tap 300x230 - JTAG Boundary-Scan Controllers

NetUSB II™ 8 TAP

The NetUSB II™ 8 TAP is a high-performance, multi-feature boundary-scan controller for multi-TAP and concurrent JTAG test and in-system programming.
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PXIe 1149.5 image - JTAG Boundary-Scan Controllers

PXIe-1149.5

The PXIe-1149.5 adds MTM-Bus master, slave, and monitoring with full IEEE-1149.5 electrical and protocol compatibility with a standard PXIe interface for convenient integration into any Test Program Set (TPS).
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PXIe 1149 web 2 235 300x213 - JTAG Boundary-Scan Controllers

PXIe-1149.1/4E™

The PXIe-1149.1/4E is a highperformance, multi-feature boundaryscan controller for multi-TAP and concurrent JTAG test and in-system programming.
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NetUSB1 e1497550610789 300x213 - JTAG Boundary-Scan Controllers

NetUSB-1149.1/E

High-Performance LAN & USB 2.0 Boundary-Scan Controller
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NetUSB11491SE1 e1497550744387 300x213 - JTAG Boundary-Scan Controllers

NetUSB-1149.1/SE

High-Performance LAN & USB 2.0 Boundary-Scan Controller
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USB 1149.1 1E1 1 thumb - JTAG Boundary-Scan Controllers

USB-1149.1/1E

High-Performance USB 2.0 Boundary-Scan Controller
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USB 11491 4E Controller thumb - JTAG Boundary-Scan Controllers

USB-1149.1/4E

High-Performance USB 2.0 Boundary-Scan Controller
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USB 1149.1 CFM1 1 e1497550070441 300x214 - JTAG Boundary-Scan Controllers

USB-1149.1/CFM

High-Speed single-TAP boundary-scan controller
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PCI 1149 Turbo1 e1497550877806 300x214 - JTAG Boundary-Scan Controllers

PCI-1149.1/Turbo

High-Performance Boundary-Scan Test and In-System Programming Controller
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PCIe 11491 Controller1 thumb - JTAG Boundary-Scan Controllers

PCIe-1149.1

High-Performance Boundary-Scan Test and In-System Programming Controller
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QuadTapCFM1 thumb2 - JTAG Boundary-Scan Controllers

QuadTAP/CFM

High-Performance Multi-TAP Boundary-Scan Controller for Teradyne In-Circuit-Testers
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TAPProtectionAdapter380x285 300x225 - JTAG Boundary-Scan Controllers

TAP Protection Adapter

Transient Suppression for Corelis JTAG Controllers
  • Transient voltage suppression for ESD, EFT, and lightning events
  • Integrated 10-Ohm series resistors for current limiting
  • IEC 61000−4−2 Level 4 ESD protection
  • Short 3” cable length between JTAG controller and adapter minimizes performance impact

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Low Voltage Adapter 1024x836 2 300x225 - JTAG Boundary-Scan Controllers

Low Voltage Adapter

TAP Adapter for Corelis JTAG Controllers
  • Converts JTAG signal levels between a TTL scan controller and a low voltage Unit Under Test (UUT).
  • Supports clock speeds up to 100 MHz.
  • Automatically detects and matches UUT reference voltage levels between 0.4V and 2.5V based on UUT connector pin.
  • Capable of driving output signals up to 90 mA, readily accommodating 50 ohm loads.

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ScanTapIsoPod thumb - JTAG Boundary-Scan Controllers

ScanTAP IsoPod

Complete TAP Signal Isolation for Corelis Boundary-Scan Controllers
  • 4 kV isolation barrier helps prevent damage to hardware
  • 3.3 V TAP interface; Supports I2C and SPI programming speeds up to 1 MHz
  • Supports JTAG test clock (TCK) frequencies up to 40 MHz
  • Supports I2C and SPI programming speeds up to 1 MHz

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Corelis JTAG Controller Features

Programmable Clock

The system-wide TCK rate for all TAP ports is programmable under software control. A wide range of TCK frequencies can be achieved by using the on-board Phase-Locked-Loop (PLL) generation circuitry. Depending on the controller, users are given the ability to select the desired TCK rate from a range of values up to 100 MHz at resolution increments of less than 2%.

Adjustable Low Voltage Outputs

The voltage level of the parallel I/O, the local TAP port, and each pod TAP is software programmable and can be set to any voltage between 1.25V and 3.3V in increments of 0.05V. The ports of the ScanTAP-4 and ScanTAP-8 pods can also be slew rate (fast/slow) adjusted.

Scan Input Signal Delay Compensation

Automatic delay compensation is inserted within the signal paths. This feature solves the well-known problems associated with the combination of high TCK rates and remote target locations at extended distances.

Target Voltage Detection System

The controller and its remote pod include analog-to-digital converters, which can measure connected power voltages from the target. Such voltages from two distinct target levels can be measured and compared against user-defined limits. This feature can provide detailed signal voltage checks at any stage of a test plan.

Automatic Detection of UUT Power Shorts

With the target powered down, a well-regulated drive current with current limit can be momentarily applied to the target power bus. By measuring this current, the approximate load resistance can be calculated. This provides for the automatic detection of target power shorts, prior to applying power to the target unit.

Top JTAG Boundary-Scan, In-System Programming, & Bus Analyzers - Corelis