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ScanExpress JET – Freescale i.MX35 CPU Support

Freescale i.MX35 CPU Support

CPU Support Library for ScanExpress JET

Ideal for the consumer, industrial, and automotive industries, Freescale ARM11™-based i.MX35 is the basis for many smart embedded systems. Of course, maintaining a high level of system quality and reliability while keeping up with rapid development and production requires an equally smart approach to test – one where the same CPU that drives the system can also provide unparalleled access to system components.

Corelis ScanExpress JET for i.MX35 utilizes the i.MX35 JTAG port to take control of the ARM11 core, enabling fast and easy test development and execution of full Corelis functional test suite for supported peripherals.

Standard and Custom Tests

Freescale i.MX35 CPU Support for ScanExpress JET includes automatic test generation for commonly used peripherals.

  • CPU Initialization – Test basic communication and functions of the CPU.
  • SDRAM – Execute a full suite of at-speed SDRAM tests to catch hard-to-find faults.
  • NAND Flash and NOR Flash – Test and program Flash using maximum CPU clock speed.
  • I2C Discovery – Scan the I2C bus to identify and communicate with connected devices.
  • UART Loopback – Verify UART communication via a simple loopback cable.
  • Ethernet Loopback – Test Ethernet functions using a simple loopback cable.
  • Power Management IC (PMIC) – Ensure that the power management system is fully functional.

Custom Tests

The ScanExpress JET development system includes a powerful scripting language and integrated script debugger; write your own tests or load compiled code right from the JET integrated development environment.

Freescale-iMX35

Supported Processors

Supported Altera Cyclone V SoC part numbers include 5CSEA2, 5CSEA4, 5CSEA5, 5CSEA6, 5CSXC2, 5CSXC4, 5CSXC5, 5CSXC6, 5CSTD5, 5CSTD6.

CPU i.MX35, Part/Model i.MX351, i.MX353, i.MX355, i.MX356, i.MX357

Applications

Test Engineers

JET is able to increase board test coverage by quickly combining boundary-scan testing with at-speed functional testing.

Design Engineers

JET assists in prototype debug before test firmware or test fixtures are available

Firmware/Software Engineers

JET is able to save coding time through automatic test and diagnostic generation.

Field Application Engineers

JET can be used to field validate a customer board or upgrade firmware on-site.

Repair Engineers

JET can identify board failures quickly reducing the repair cost per unit.

Freescale-iMX35

Success Story

Fluke med - ScanExpress JET - Freescale i.MX35 CPU Support
testimonial icon - ScanExpress JET - Freescale i.MX35 CPU SupportRead how Fluke used JTAG Embedded Test tools on the i.MX processor with their new Process Calibration line of products.

ScanExpress JET 13 Point Benefit

The JTAG Embedded Test (JET) method extends coverage beyond popular boundary-scan techniques to virtually every signal of the UUT that is accessible by on-board CPU(s). This includes most of the remaining non-scannable, analog and I/O port resources.

Ordering Information

Part Number—20736

JET Family Support Package for Freescale i.MX35x Processors.

Part Number—20700

ScanExpress JET Test Development System supporting both Test Program Generation and Execution.

Need Assistance?

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If you would like assistance with implementing JTAG testing in your design, or you are simply short of resources, our talented and experienced engineering staff can help you with all your JTAG needs.

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