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ScanExpress JET – NXP MPC56xx CPU Support

NXP MPC56xx CPU Support

CPU Support Library for ScanExpress JET

Ultra-reliable MPC56xx microcontrollers (MCUs) from NXP are used in a broad range of automotive and industrial applications where not only is reliability paramount, but increased system complexity and diminished test access have reduced the effectiveness of traditional embedded system tests.

ScanExpress JET™ takes control of the Power Architecture® core in the MPC56xx series of microcontrollers using a simple JTAG port to functionally test, verify, and program SDRAM, NOR Flash, and addition al peripherals to ensure interface integrity and peripheral functionality. JET technol ogy provides convenient system hardware verification throughout the entire product life cycle, even before boot and applica tion code are available.

Standard and Custom Tests

ScanExpress JET can be used to generate a standard set of tests or to create custom test scripts for peripherals connected to the microcontroller.

  • MCU Initialization—Test basic communication and functions of the MCU.
  • SDRAM Test—Execute a complete suite of SDRAM tests to identify functional faults at full MCU speed.
  • NOR Flash—Test, program, and verify NOR Flash at high speeds using a simple JTAG interface.
  • Custom Tests—The ScanExpress JET development system includes a powerful scripting language and integrated script debugger; write your own test scripts or load compiled code right from the JET integrated development environment.
Diagram of a typical system configuration. ScanExpress JET controls the Power Architecture core to test supported peripheral devices.
Figure 1. Diagram of a typical system configuration. ScanExpress JET controls the Power Architecture core to test supported peripheral devices.

Supported Processors

Supported microcontrollers include all NXP MPC56xx series components with Power Architecture e200 cores.

Applications

Test Engineers

JET is able to increase board test coverage by quickly combining boundary-scan testing with at-speed functional testing.

Design Engineers

JET assists in prototype debug before test firmware or test fixtures are available

Firmware/Software Engineers

JET is able to save coding time through automatic test and diagnostic generation.

Field Application Engineers

JET can be used to field validate a customer board or upgrade firmware on-site.

Repair Engineers

JET can identify board failures quickly reducing the repair cost per unit.

Diagram of a typical system configuration. ScanExpress JET controls the Power Architecture core to test supported peripheral devices.
Figure 1. Diagram of a typical system configuration. ScanExpress JET controls the Power Architecture core to test supported peripheral devices.

ScanExpress JET 13 Point Benefit

The JTAG Embedded Test (JET) method extends coverage beyond popular boundary-scan techniques to virtually every signal of the UUT that is accessible by on-board CPU(s). This includes most of the remaining non-scannable, analog and I/O port resources.

Ordering Information

Part Number—20744

JET Family Support Package for NXP MPC56xx microcontrollers.

Part Number—20700

ScanExpress JET Test Development System supporting both Test Program Generation and Execution.

Need Assistance?

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If you would like assistance with implementing JTAG testing in your design, or you are simply short of resources, our talented and experienced engineering staff can help you with all your JTAG needs.

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