ScanExpress JET™ Soars to Expand Boundary-Scan Test Coverage
ScanExpress JET™ bridges the gap between JTAG and functional test methods,
providing a superior solution to customers requiring the highest test coverage.
Cerritos, CA, March 15, 2007 – Corelis Inc., a leading supplier of high-performance boundary-scan and JTAG emulation debug tools for microprocessors, announced today the availability of ScanExpress JET™, an innovative test tool which combines boundary-scan and functional test technologies to achieve higher test coverage. Dubbed JTAG Embedded Test (JET), the software combines common pin and net level diagnostics using boundary-scan testing with CPU emulation testing through its JTAG port. This provides functional test capabilities on designs utilizing JTAG compatible CPUs to even non-JTAG peripheral components including analog parts connected within the CPU address and I/O space. This means that sound structural tests for opens and shorts can be performed via boundary-scan while at-speed functional testing can be performed using the CPU to run test programs loaded into memory. Before loading test programs into on-board memory, ScanExpress JET is using a proprietary technique to test the on-board memory at speed without loading any code into this memory. This means that ScanExpress JET can test and diagnose faulty boards and systems even when the embedded CPU is not able to boot and the board self test is not operational.
ScanExpress JET carries existing boundary-scan testing to the next level. Because no single test technology offers 100% test coverage, test engineers are constantly looking at ways to combine the strengths of each test methodology and maximize the overall testability of their products.
ScanExpress JET now offers a feasible way to close the gap between boundary-scan testing and functional testing. Utilizing a single software and hardware tool to combine the two technologies reduces test integration time yet still provides greater test coverage.
Users can access pre-built functional tests or create functional test scripts from scratch to test non-standard parts. Furthermore, because ScanExpress JET seamlessly integrates with existing Corelis hardware, existing ScanExpressTPG™, and ScanExpress Runner™ customers can add-on this functionality without having to purchase an additional JTAG controller to access the embedded CPU. Corelis multi-TAP controllers can provide emulation and debug capability on one TAP while connecting the rest of the boundary-scan chain on separate TAPs. No other test tool currently allows this configuration. Performing all of the testing from a single JTAG controller not only reduces cost, but also simplifies the hardware required for testing and the connection to the product under test.
“Test technologies have been grouped into separate classes for years. These technologies are commonly referred to as manufacturing defect analysis (MDA), in-circuit test (ICT), and functional test,” said Karla May, Boundary-Scan Product Marketing Manager at Corelis. “Our customers are looking for ways to bridge the gaps between these test technologies. ScanExpress JET offers a first step toward this goal. The addition of ScanExpress JET certainly provides our customers the means to achieve higher test coverage within an already mature high performance boundary-scan tools set.”
ScanExpress JET takes advantage of the fact that most of the 32-bit and 64-bit processors have a built-in JTAG emulation debug port. ScanExpress JET uses the JTAG debug port to control the CPU and perform functional tests.
Pricing and Availability
ScanExpress JET is available now. Pricing starts at $17,000.
Corelis, an EWA company, offers a broad line of test, programming, development and bus analysis products that combine exceptional ease-of-use with advanced technical innovation. Corelis also provides custom engineering services and is well known for its outstanding customer support.