Design for Testability Review

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Design for Testability (DFT Test) Review

Corelis can provide you with design consultation and an analysis of your design for boundary-scan testability. We will review your design and make specific recommendations that if implemented will improve the testability. We can also suggest improvements that will increase test coverage and allow boundary-scan to be implemented in a more cost-effective manner.

This service also includes a DFT test coverage analysis that we recommend to do after schematic capture and before PCB layout. At this stage of product development, Corelis provides you with a comprehensive test coverage reports that identifies all of the boundary-scan nets and pins and classifies them as completely tested, partially tested, or not tested. The report also recommends where to add test points (pads) for physical “nails” access if additional test coverage is required.

  • FREE JTAG DFT Analysis for Qualified Customers

    Corelis is offering first time users a FREE, step-by-step JTAG/boundary-scan DFT analysis of your design. We will review your design and make specific recommendations that if implemented will improve the testability of your board and will reduce the odds of "respinning" your first prototype. We will also suggest improvements to your boundary-scan design, that will improve board test coverage and allow you to implement boundary-scan test and in-system programming in a more cost-effective manner.

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