Applications

Test access limitations have made it increasingly difficult to probe and troubleshoot electronic system prototypes. JTAG provides access to dense circuit boards with ball-grid-array (BGA) components, including signals with no physical access points.

Applications

Today’s high density designs limit the amount of test coverage obtainable through bed-of-nails testing, driving the need for JTAG/boundary-scan based tests to ensure a high level of discovery and diagnosis of manufacturing faults.

Applications

Whether developing new code for an embedded system prototype, programming components on the manufacturing line, or updating code in the field, Corelis’ in-system-programming (ISP) tools make it easy to integrate device programming with your test process.

Applications

Early fault detection with accurate diagnostics is key to maintaining a high quality, rapid production line. JTAG allows signals to be controlled and observed independently of the system logic, for quick and easy functional testing of logic components.

Applications

Manufacturing defects don’t have to mean scrapping circuit boards; Corelis ScanExpress tools can pinpoint defects at the net and pin level and even display the possible fault locations on a photograph or CAD data of the printed circuit board assembly (PCBA).

Applications

Corelis hardware is convenient and portable; a USB-based JTAG controller and laptop offer the ultimate desktop test station. Systems with a USB port can also be designed to allow USB-to-JTAG access, further reducing the amount of equipment required by field technicians.