Development and Debug
Test access limitations have made it increasingly difficult to probe and troubleshoot electronic system prototypes. JTAG provides access to dense circuit boards with ball-grid-array (BGA) components, including signals with no physical access points.
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Manufacturing Test
Today’s high density designs limit the amount of test coverage obtainable through bed-of-nails testing, driving the need for JTAG/boundary-scan based tests to ensure a high level of discovery and diagnosis of manufacturing faults.
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In-System Programming
Whether developing new code for an embedded system prototype, programming components on the manufacturing line, or updating code in the field, Corelis’ in-system-programming (ISP) tools make it easy to integrate device programming with your test process.
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Functional Testing
Early fault detection with accurate diagnostics is key to maintaining a high quality, rapid production line. JTAG allows signals to be controlled and observed independently of the system logic, for quick and easy functional testing of logic components.
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Circuit Board Repair
Manufacturing defects don’t have to mean scrapping circuit boards; Corelis ScanExpress tools can pinpoint defects at the net and pin level and even display the possible fault locations on a photograph or CAD data of the printed circuit board assembly (PCBA).
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Field Service
Corelis hardware is convenient and portable; a USB-based JTAG controller and laptop offer the ultimate desktop test station. Systems with a USB port can also be designed to allow USB-to-JTAG access, further reducing the amount of equipment required by field technicians.
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