What’s New in ScanExpress 10.2.0

Fixes and Improvements

ScanExpress version 10.2.0 is a maintenance release with improvements across multiple ScanExpress applications. This includes improved interface enhancements, improved device support, and more. Customers with a current support contract are welcome to upgrade for the latest fixes and improvements.

ScanExpress Release Notes

ScanExpress Application Version Summary

ApplicationVersion
ScanExpress Debugger6.18.0
ScanExpress DFT Analyzer2.17.0
ScanExpress Flash Generator3.21.0
ScanExpress Programmer1.34.0
ScanExpress Runner6.38.0
ScanExpress Runner Gang4.69.0
ScanExpress TPG/Merge/JET2.33.0
ScanExpress Viewer2.18.0

ScanExpress Application Updates

General

  • SER-515: Updated NetUSB firmware to v1.35 to resolve possible issues executing some JAM/STAPL files for Intel MAX 10 devices.
  • SEBT-332: Updated NetUSB II self-test utility to address possible intermittent PMIC test failure.

ScanExpress Debugger (6.18.0)

  • SED-32: Resolved issue opening chip display after it had been previously opened on another monitor or resolution.
  • SEBT-333: Added automatic conversion of NetUSB-1149.1 parameter strings for NetUSB II if controller is present instead of NetUSB-1149.1 when using DLL API.
  • SEBT-334: Updated DLL API to allow calling of spdInitHardware again after having called spdShutdownHardware.
  • SER-584: Resolved possible crash when infrastructure test fails.
  • SEBT-327: Resolved configuration dialog display issues under some Windows language packs.
  • SETPG-295: Improved #include file support in Advanced Scripting.

ScanExpress DFT Analyzer (2.17.0)

  • No changes.

ScanExpress Flash Generator (3.21.0)

  • No changes.

ScanExpress JET (2.33.0)

  • SETPG-295: Improved #include file support in JET scripting.
  • SEBT-327: Resolved configuration dialog display issues under some Windows language packs.
  • SEJET-268: Resolved issue with NAND flash devices not being listed for the OMAP3530 processor.
  • SEJET-269: Resolved issue where compiled custom tests would still require the original script file.
  • SEJET-273: Resolved issue accessing memory addresses above 4 GB on 64-bit ARM processors.
  • SEJET-274: Resolved issue setting NAND flash block count when generating flash tests.

ScanExpress Programmer (1.34.0)

  • SEBT-318: Added support for AMD programming strategy devices with internal sector blank check commands to greatly decrease blank check execution time.
  • SEBT-333: Added automatic conversion of NetUSB-1149.1 parameter strings for NetUSB II if controller is present instead of NetUSB-1149.1 when using DLL API.
  • SEBT-334: Updated DLL API to allow calling of sepLoadSettingFile again after having called sepCleanup.
  • SEBT-337: Resolved issue programming and verifying non-contiguous addresses of SPI flash devices.
  • SER-584: Resolved possible crash when infrastructure test fails.
  • SEBT-327: Resolved configuration dialog display issues under some Windows language packs.

ScanExpress Runner (6.38.0)

  • SEBT-318: Added support for AMD programming strategy devices with internal sector blank check commands to greatly decrease blank check execution time.
  • SEBT-333: Added automatic conversion of NetUSB-1149.1 parameter strings for NetUSB II if controller is present instead of NetUSB-1149.1 when using DLL API.
  • SEBT-334: Updated DLL API to allow calling of InitHardware again after having called CleanupHardware.
  • SEBT-337: Resolved issue programming and verifying non-contiguous addresses of SPI flash devices.
  • SER-584: Resolved possible crash when infrastructure test fails.
  • SEBT-327: Resolved configuration dialog display issues under some Windows language packs.

Runner Gang (4.69.0)

  • SEBT-333: Added automatic conversion of NetUSB-1149.1 parameter strings for NetUSB II if controller is present instead of NetUSB-1149.1 when using DLL API.
  • SEBT-334: Updated DLL API to allow calling of InitHardware again after having called CleanupHardware.
  • SEBT-337: Resolved issue programming and verifying non-contiguous addresses of SPI flash devices.
  • SER-584: Resolved possible crash when infrastructure test fails.

ScanExpress TPG (2.33.0)

  • SETPG-264: Accept BSDL files that use bit vector notation (pin ID in parentheses) where a single bit pin ID without parentheses is expected. This will now produce a warning instead of error.
  • SEBT-327: Resolved configuration dialog display issues under some Windows language packs.
  • SETPG-295: Improved #include file support in TPG scripting.

ScanExpress Viewer (2.18.0)

  • No changes.

Previous Releases