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What’s New in ScanExpress 10.6.0

Coldfire BDM Support with ScanExpress JET

ScanExpress JET can now support the Background Debug Mode (BDM) interface when using USB-1149.1/1E, USB-1149.1/4E, and NetUSB II JTAG controllers. BDM is commonly used in NXP microcontrollers in place of JTAG and allows ScanExpress JET to communicate with the processor core and execute at-speed embedded hardware tests. For NetUSB II, TCK Mode must be set to Gated when connecting to BDM interfaces, and the interface should be connected as defined in the table below.

Table 1. Corelis Controller to BDM Pin Mapping

I2C ACK Test

I2C protocol flash/EEPROM devices can now include a non-intrusive ACK test to check for device I2C device presence without altering the device contents. Existing flash tests must be regenerated in Flash Generator to enable the option.

Bug Fixes and Improvements

ScanExpress version 10.6.0 also includes fixes and improvements across multiple ScanExpress applications. Customers with a current support contract are encouraged to upgrade to the latest versions.

ScanExpress Application Version Summary

Application	Version
ScanExpress TPG/Merge/JET	2.37.0
ScanExpress Debugger	6.22.0
ScanExpress DFT Analyzer	2.19.0
ScanExpress Flash Generator	3.24.0
ScanExpress Programmer	1.38.0
ScanExpress Runner	6.42.0
ScanExpress Runner Gang	4.73.0
ScanExpress Viewer	2.20.0

ScanExpress Application Updates

General

SEBT-406: Updated Corelis Server Activation Utility installer to resolve issues with automatic LMADMIN configuration.
SEBT-408: Updated license server vendor daemon to resolve issue where application License Manager windows could display an incorrect seat count.

ScanExpress Debugger (v6.22.0)

SEBT-402: Resolved issue with Configuration dialog display at high DPI.

ScanExpress DFT Analyzer (v2.19.0)

SEDFT-70: Updated chart graphics library used for reports.

ScanExpress Flash Generator (v3.24.0)

SER-543: Added flash interconnect option for I2C (EEPROM3 strategy) devices. This includes an I2C bus address ACK check. Existing flash tests must be regenerated in Flash Generator to enable the option.

ScanExpress JET (v2.37.0)

SEJET-88: Added support for NXP ColdFire and BDM interface using NetUSB II, USB/1E, or USB/4E controllers.
SEJET-615: Resolved AMD NOR flash programming issue when there are multiple devices in parallel and write buffer is used.

SEJET-603: Resolved issue with the Register Initialization Utility generating a script with a syntax error for the LS1046A.
SEJET-611: Corrected processor names in the JET Library Browser.

ScanExpress Programmer (v1.38.0)

SER-543: Added flash interconnect option for I2C (EEPROM3 strategy) devices. This includes an I2C bus address ACK check. Existing flash tests must be regenerated to enable the option.
SEP-231: Added Topology Auto-Detect feature to Target Assisted Flash (TAF) configuration dialog.
SEP-232: Resolved issue with TAF always running a JTAG infrastructure test when using a custom initialization script.
SEP-236: Resolved NetUSB II configuration error message when using Gang Programming. Resolved issue where changes made via the Gang Programming dialog and Controller Configuration dialog could result in an inconsistent state.

ScanExpress Runner (v6.42.0)

SEJET-88: Added support for JET/ColdFire.
SER-543: Added flash interconnect option for I2C (EEPROM3 strategy) devices. This includes an I2C bus address ACK check. Existing flash tests must be regenerated to enable the option.
SER-830/SER-831: Resolved potential conflicts between global TAP configuration and individual test step options.
SER-41: Resolved potential crash when loading corrupted CVF or FPI files.
SER-832: Resolved issue with multiple error popups when there is a CVF loading error.
SERG-101: Resolved potential issue where flash programming operations with gang TAP configuration could fail for some device types.
SER-824: Resolved issue where flash test step “Re-run Test Step If Failed” option could improperly exclude previously failed UUTs with gang TAP configuration.

ScanExpress Runner Gang (v4.73.0)

SER-543: Added flash interconnect option for I2C (EEPROM3 strategy) devices. This includes an I2C bus address ACK check. Existing flash tests must be regenerated to enable the option.
SER-41: Resolved potential crash when loading corrupted CVF or FPI files.
SER-832: Resolved issue with multiple error popups when there is a CVF loading error.
SERG-101: Resolved issue where gang flash programming could incorrectly fail in multiple UUT mode but correctly pass in single UUT mode.

ScanExpress TPG (v2.37.0)

SER-543: Added flash interconnect option for I2C (EEPROM3 strategy) devices. This includes an I2C bus address ACK check. Existing flash tests must be regenerated in TPG to enable the option.

SEBT-402: Resolved issue with Configuration dialog display at high DPI.