What’s New in ScanExpress 9.4

ScanExpress Runner Asynchronous API

ScanExpress Runner now includes an asynchronous API for integration with third-party applications. The asynchronous execution functions allow applications to integrate ScanExpress Runner functionality without having to wait for execution to finish—applications can now begin execution and then poll to determine current status or abort the current execution.

The new functions are:

AsyncAbort() Aborts asynchronous Test Plan execution.
AsyncGetStatus() Retrieves the current status and completion percentage of asynchronous Test Plan execution.
AsyncRunTestPlan() Runs the currently loaded Test Plan asynchronously, returning immediately.

ScanExpress Runner Diagnostic & Logging Improvements

ScanExpress Runner now includes full test plan and test step path information in the test log file for improved traceability. Additionally, flash manufacturer and device ID information will now be included in diagnostics and test logs when Device ID tests pass. Finally, we’ve improved JAM/STAPL diagnostics to include additional checksum data when available.

ScanExpress Runner Gang USB-1149.1/4E

ScanExpress Runner Gang can now utilize USB-1149.1/4E and QuadTAP/CFM hardware for concurrent test execution. Gang (concurrent) tests on up to 4 TAPs can now be run on the benchtop with USB-1149.1/4E hardware or integrated into Teradyne testers with the QuadTAP/CFM and expander cards.

ScanExpress JET CPU Support & Improvements

ScanExpress JET now supports Marvell OCTEON III CN7200 Multi-Core MIPS64 Processors and Texas Instruments TMS320C6748 DSP Processors. Each new processor support package includes base RAM and NOR flash tests and programming support. Please contact Corelis Sales for pricing and availability. Additionally, Ethernet loopback tests are now included for NXP i.MX6 Applications Processors.

ScanExpress 9.4 Release Notes

General

  • SEBT-126: Resolved an issue with old NetUSB II firmware versions being reported incorrectly.

ScanExpress Flash Generator

  • SEFG-3: Resolved an issue where the Ctrl+R shortcut keys would not open the Programming Options dialog.

ScanExpress JET

  • SEJET-74: Resolved an erase and program status polling issue with Zynq7000 SPI NOR Flash.
  • SEJET-97: Resolved an issue with MIPS64 processors after data transfer of 64KB or greater.
  • SEJET-24: Added basic support for Marvell Cavium CN7200.
  • SEJET-80: Added basic support for TI TMS320C6748 DSP.
  • SEJET-63: Added Ethernet loopback test for i.MX6.

ScanExpress Programmer

  • SER-14: Resolved an issue where STAPL verification could fail using a NetUSB-1149.1/E over a network connection.
  • SER-32: Flash manufacturer and device IDs will now be included in diagnostic output when the ID tests pass.
  • SEP-15: Resolved an issue with relative paths and current working directory when using the DLL API to run TAFP files.

ScanExpress Runner

  • SER-66: Added asynchronous test plan execution functions to the ScanExpress Runner DLL API.
  • SER-43: Full test plan and test step paths will now be included in the test log file. Additionally, checksum support for JAM/STAPL has been improved.
  • SER-20: Increased the size limit of the Test Results window.
  • SER-14: Resolved an issue where STAPL verification could fail using a NetUSB-1149.1/E over a network connection.
  • SEBT-98 & SER-63: Resolved issues with the NetUSB II when using the ScanExpress Runner DLL API.
  • SER-32: Flash manufacturer and device IDs will now be included in diagnostic output when Device ID tests pass.

ScanExpress Runner Gang Edition

  • SERG-11: Concurrent tests can now be executed using the USB-1149.1/4E 4-TAP JTAG controller.
  • SERG-20 & SERG-25: Resolved an issue with NetUSB II that occurred when test plans switch between parallel and sequential execution.
  • SER-32: Flash manufacturer and device IDs will now be included in diagnostic output when Device ID tests pass.

ScanExpress TPG

  • SETPG-55: Resolved an issue where the scan_spi_wrt_rd() script function did not return correct data.
  • SETPG-57: Resolved an issue where the New MIF button on the MIF Search did not reposition when the window was resized.
  • SETPG-60: Resolved an issue where some netlist files were not being copied to the source directory.
  • SETPG-62: Resolved an issue where the Cluster Wizard would hang when using long net names.

ScanExpress Viewer

  • SEV-18: Improved ODB++ support for displaying circular boards and components.
  • SEV-20: Resolved an issue where filtering by pin name in the Devices docking window could cause an application crash.

Known Issues

ScanExpress Runner Gang Edition

Known issues with SERG-11:

  • Direct flash programming using I2C/SPI is not supported in gang mode.
  • Gang flash programming using external write-enable is not supported.
  • Enabling “Scan Chain Integrity Check” flash programming test step option may hang the controller in gang mode; it is recommended that this option be disabled.