What’s New in ScanExpress 10.1.0

SWD Support

The NetUSB II firmware has been updated to support ARM’s Serial Wire Debug (SWD) interface. The new SWD interface allows ScanExpress software to support JTAG Embedded Test (JET) and Target-Assisted Flash Programming (TAFP) on systems that use SWD in place of JTAG. Starting with STM32 32-bit ARM Cortex MCUs, SWD allows the same hardware used for JTAG to also interface with 2-wire SWD devices. SWD is currently supported only on NetUSB II hardware.

Bug Fixes and Improvements

ScanExpress version 10.1.0 is a feature release with improvements across multiple ScanExpress applications. This includes improved interface enhancements, improved device support, and more. Customers with a current support contract are welcome to upgrade for the latest bug fixes and improvements.

ScanExpress Release Notes

ScanExpress Application Version Summary

Application Version
ScanExpress Debugger 6.17.0
ScanExpress DFT Analyzer 2.17.0
ScanExpress Flash Generator 3.21.0
ScanExpress Programmer 1.33.0
ScanExpress Runner 6.37.0
ScanExpress Runner Gang 4.68.0
ScanExpress TPG/Merge/JET 2.32.0
ScanExpress Viewer 2.18.0

ScanExpress Application Updates

General

  • SEBT-326: Resolved NetUSB II firmware update utility error when file path contains underscores.

ScanExpress Debugger (6.17.0)

  • SED-26,SETPG-284: Documentation corrections and improvements.

ScanExpress DFT Analyzer (2.17.0)

  • No changes.

ScanExpress Flash Generator (3.21.0)

  • No changes.

ScanExpress JET (2.32.0)

  • SEJET-260,SEJET-261: Added basic and NAND flash support for NXP QorIQ Layerscape LS1046A.
  • NETUSBII4-94: Added STM32 SWD interface support using NetUSB II controller with firmware v2.04.
  • SEJET-9: Added STM32 internal flash programming support.
  • SEJET-252: Improved real time data bus tests to better catch certain faults.
  • SEJET-255: Resolved issue with error opening script file after editing JET test step.
  • SETPG-253: Documentation corrections and improvements.

ScanExpress Programmer (1.33.0)

  • SEJET-260/SEJET-261: Added TAFP support for NXP QorIQ Layerscape LS1046A.
  • NETUSBII4-94: Added TAFP STM32 SWD interface support using NetUSB II controller with firmware v2.04.
  • SEJET-9: Added TAFP STM32 internal flash programming support.

ScanExpress Runner (6.37.0)

  • SEBT-324,SERG-35: Resolved possible hang with the “Scan Chain Integrity Check” flash programming test step option when using USB-1149.1/4E controllers in gang mode at higher TCK.
  • USB4E-39: Resolved issues setting custom pinout configurations for USB-1149.1/4E controllers.
  • SER-131: Resolved an issue where the last test step in a test plan would not loop when using the “Loop on Test Step” option in conjunction with Flow Control.
  • SER-136: Moved options from the Properties dialog to the Test Plan and User Settings Configuration dialogs so they are easier to find.

Runner Gang (4.68.0)

  • SEBT-324,SERG-35: Resolved possible hang with the “Scan Chain Integrity Check” flash programming test step option when using USB-1149.1/4E controllers in gang mode at higher TCK.
  • USB4E-39: Resolved issues setting custom pinout configurations for /4E controllers.
  • SERG-48: Resolved issue using 1+2+3 and 1+2+3+4 TAP chaining configurations in Single UUT mode with USB-1149.1/4E controllers.

ScanExpress TPG (2.32.0)

  • SETPG-270: Resolved issues with MCD BSDL selection and reordering.
  • SETPG-280: Improved performance of Constraints screen when there are a large number of constraints.
  • SETPG-281: Added “Most Relevant” filter to Power & Ground screen for consistency with other screens.
  • SETPG-171,SETPG-210,SETPG-282,SETPG-284,SETPG-253: Documentation corrections and improvements.

ScanExpress Viewer (2.18.0)

  • No changes.

Previous Releases

ScanExpress 10.0.0 Release Notes

ScanExpress 9.10 Release Notes

ScanExpress 9.9 Release Notes

ScanExpress 9.8 Release Notes

ScanExpress 9.7 Release Notes

ScanExpress 9.6 Release Notes

ScanExpress 9.5 Release Notes

ScanExpress 9.4 Release Notes