Contents

What’s New in ScanExpress 9.13.0

ScanExpress Application Versions

Application	Version
ScanExpress Debugger	6.14.0
ScanExpress DFT Analyzer	2.16.0
ScanExpress Flash Generator	3.21.0
ScanExpress Programmer	1.30.0
ScanExpress Runner	6.34.0
ScanExpress Runner Gang	4.65.0
ScanExpress TPG/Merge/JET	2.29.0
ScanExpress Viewer	2.18.0

SER-505: Added confirmation prompt to Flash Options dialog when no operations are enabled.

SEJET-246: Fixed possible register initialization utility issue with Zynq-7000 DDR initialization and improved Zynq-7000 ethernet loopback to check PHY address.
SEJET-247: Fixed issue where not all parameters had default values in Zynq-7000 SPI flash tests.
SEJET-83: Corrected JETRunnerAPI DLL documentation for JET_API_RunFile()
SEJET-162: Resolved possible crash during Generation with long project names.

SEP-69: Changed flash block unlocking to occur after device ID check rather than before.
SER-505: Improved FPI diagnostic output message when no flash operations are enabled.

SEBT-314: Resolved issues with TRST and parallel IO when switching between TAPs using USB-1149.1/4E.
SER-141: Allow Setup menu shortcut keys (e.g. F2, F3, etc.) to switch tabs in the Configuration dialog.
SER-529: Eliminated unexpected TAP voltage warning when current controller is set to the Null Device.
SER-475: Resolved potential error when executing a script that calls scan_set_test_coverage() and attempts to store the result in a variable.
SEP-69: Changed flash block unlocking to occur after device ID check rather than before.
SER-568: Added display legend to Truth Table Diagnostics window.
SER-241: Added right-click menu options to copy text (e.g. net name, device pin, etc.) from Truth Table Diagnostics window.
SER-505: Improved FPI test step diagnostic log output when no flash operations are enabled and added confirmation prompt to Flash Options dialog when no operations are enabled.
SER-509: Allow naming of CVF files without test type suffix (e.g. _inf, etc.).
SER-510 & SER-511: Added Test Step Label column, File Path column, and column selection control to Test Plan Generation screen.
SEBT-316: Resolved issue where passing infrastructure results could show incorrect USERCODE bits.
SEBT-317: Added display of actual unmasked Expanded IR Capture Test bits in passing infrastructure test results.

USB4E-7: Resolved possible failures when test steps switch between TAPs using USB-1149.1/4E controller.
SEBT-314: Resolved issues with TRST and parallel IO when switching between TAPs using USB-1149.1/4E.
SER-141: Allow Setup menu shortcut keys (e.g. F2, F3, etc.) to switch tabs in the Configuration dialog.
SER-529: Eliminated unexpected TAP voltage warning when current controller is set to the Null Device.
SER-475: Resolved potential error when executing a script that calls scan_set_test_coverage() and attempts to store the result in a variable.
SEP-69: Changed flash block unlocking to occur after device ID check rather than before.
SER-505: Improved FPI test step diagnostic log output when no flash operations are enabled and added confirmation prompt to Flash Options dialog when no operations are enabled.
SER-509: Allow naming of CVF files without test type suffix (e.g. _inf, etc.).

SETPG-178: Added .eds to file type filters for EDIF netlists.
SETPG-263: Resolved issue where TPG would warn that a flash device model was updated but would not apply the update when regenerating the FPI.
SER-475: Resolved potential error when executing a script that calls scan_set_test_coverage() and attempts to store the result in a variable.
SETPG-180: Prevented launching of ScanExpress Runner from the Shortcut bar during test generation to avoid a potential file access error when loading the test plan.
SEBT-312: Added support for ODB++ netlists in .7z
SER-505: Added confirmation prompt to Flash Options dialog when no operations are enabled.
SETPG-272: Improved launching of Adobe Reader to avoid possible timeout error.
SETPG-274: Allow package description files referenced by BSDL to have a .ALL file extension.
SETPG-276: Updated IEEE-1149.6 standard description files so BSDL may use either STD_1149_6_2003 or STD_1149_6_2015.

SEBT-312: Added support for ODB++ files in .7z format.
SEV-28: Improved support for Cadence ODB++ files.
SEV-31: Resolved issue selecting device pins from image when using some ODB++ files.
SEV-33: Resolved issue with trace color selector appearing on a different monitor.