What’s New in ScanExpress 9.9.0

ScanExpress Application Versions

Application Version
ScanExpress Debugger 6.11.0
ScanExpress DFT Analyzer 2.14.0
ScanExpress Flash Generator 3.18.0
ScanExpress Programmer 1.27.0
ScanExpress Runner 6.30.0
ScanExpress TPG/Merge/JET 2.25.0
ScanExpress Viewer 2.14.0

NAND Flash Bad Block Management

ScanExpress Software now includes bad block management for NAND flash devices when erasing, programming, and verifying with boundary-scan flash in-system-programming software. The skip block method will be used to read factory bad block markers and automatically skip to the next available block. Support is included in ScanExpress in-system-programming applications, including ScanExpress Flash Generator, ScanExpress Runner, ScanExpress Programmer, and more.

ScanExpress Release Notes

ScanExpress 9.9.0

General

  • SEFG-21: Added support for newer Micron SPI NAND flash devices.
  • SEFG-12: Added support for skipping and recording bad blocks during NAND flash programming operations.

ScanExpress Programmer

  • SEP-64: Resolved an issue where TAFP operations could fail when using the SEPdll.dll on some systems.

ScanExpress Runner

  • SER-544: Resolved an issue where FPI execution could fail with some boundary-scan controllers.
  • SER-545: Resolved an issue where JET test step output was not being logged when using the “Log All Errors” setting.
  • SER-539: Resolved an issue where the application could fail to create or update intermediate SVF or JAM/STAPL execution files with read-only file permissions.
  • SER-548: Resolved an issue where the flash programming block locking list and custom data list would display incorrect values.

Previous Releases

ScanExpress 9.8 Release Notes

ScanExpress 9.7 Release Notes

ScanExpress 9.6 Release Notes

ScanExpress 9.5 Release Notes

ScanExpress 9.4 Release Notes