At Speed Functional Testing



Functional circuit board testing presents many challenges that are often costly and time-consuming. Most functional tests need to be customized for each design, limiting reusability. This results in software engineers vying for time between development code and test code. Even when functional tests become available, the diagnostic details are often inadequate to give clear visibility on a given problem.

ScanExpress JET is a software solution designed to overcome these challenges by automating the functional test generation process on CPU–based IEEE-1149.1 compliant circuit boards. Coined JTAG Embedded Test, JET is the preferred method for at-speed, non-intrusive functional testing.

Content Agenda
Corelis Overview and History
What is ScanExpress JET?
Features and Benefits of ScanExpress JET
Supported Processors
HW Connection Devices
Live Demo of ScanExpress JET and Runner
Live Q & A

by Jay Marcinczyk
Field Applications Engineer
Corelis Inc.

Jay Marcinczyk, a Field Application Engineer for Corelis, has an extensive background in the embedded systems field as a tester, developer, and coder. From testing software on nuclear submarines to developing embedded diagnostics for some of the first Dell computers. The last half of his career has been working on the Sales team as an FAE. But don’t hold that against him.

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