Corelis Design for Test (DFT) Whitepaper

Download Guidelines for Boundary-Scan Testing

In today’s fast paced environment with short time-to-market requirements, it has become increasingly important to design products that allow for early fault and failure detection. The earlier a mistake or a defect can be detected in the design phase or in the production process, the less money it will cost to remedy it and the sooner the product will be ready for production or shipment. Therefore, a good Design-For-Test (DFT) strategy is needed for the design, prototype and production phase of a product.

Article Includes:

  • 58 pages of DFT guide information
  • Why Test, What is Boundary-Scan, What is JTAG Emulation Test
  • Design Considerations and Component Selection
  • Boundary-Scan Chain and Boundary-Scan Devices
  • Control of Non Boundary-Scan Devices
  • Connectors and Other Interfaces
  • Device-Specific Considerations
  • Test Expectations
  • At-Speed Functional Testing
  • Finding Faults and more…
Corelis Design for Test (DFT) Whitepaper

  • FREE JTAG DFT Analysis for Qualified Customers

    Corelis is offering first time users a FREE, step-by-step JTAG/boundary-scan DFT analysis of your design. We will review your design and make specific recommendations that if implemented will improve the testability of your board and will reduce the odds of "respinning" your first prototype. We will also suggest improvements to your boundary-scan design, that will improve board test coverage and allow you to implement boundary-scan test and in-system programming in a more cost-effective manner.

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