Major Benefits of IEEE 1149.7 Whitepaper
Download Whitepaper on Latest IEEE Standard
While JTAG has been in use for over 20 years, and will probably continue to be used far into the foreseeable future, the recently released standard IEEE 1149.7 (Standard for Reduced-pin and Enhanced-functionality Test Access Port and Boundary Scan Architecture) has been created to improve upon it and extend its capabilities. The goal was not to replace IEEE standard 1149.1 but to create a complementary standard that addresses the recent changes in the integrated circuit technology and topology. The new standard builds on the existing one in order to implement additional functionality and maximize debug performance while simultaneously maintaining backwards compatibility.
Summary of Major New Features
Summary of Major Benefits
Reduced Pin Count
Chip Level Bypass and Individual Device Addressing
Free Whitepaper on IEEE 1149.7
The new IEEE 1149.7 standard (cJTAG or Compact JTAG) provides several major benefits to both board designers and embedded engineers.